Wuhan Jingce Electronic Group Co., Ltd.

Wuhan University

Zhao Liu

Zengqiang Zheng

Yong Ma

Yafei Shen

Xiaofan Feng

Ronghua Liu

Jingxian Liu

Yanmin Xu

Erwei Ma

Huanhuan Li

Hongjun Wu

Haisen Tong

Li Qin

A method and a system for determining a safe under keel clearance of an ultra-large ship are provided. The method comprises: acquiring operation parameter values of the ship; obtaining fluid pressure according to the values; obtaining a squat force and a trim moment of the ship according to the pressure; establishing a mirror image model based on speed potential to establish a squat clearance calculation model for the ship; determining a half-wave rising height with above calculation model; obtaining draught and trim changes according to the squat force and the trim moment, to determine a maximum squat clearance of the hull; determining the safe under keel clearance; and controlling the squat clearance of the ship according to the safe under keel clearance of the ship, to avoid navigation dangers, and improve the loading rate.

Method and system for determining safe under keel clearance of ultra-large ship

A method of Mura defect repair, the method including: decoding an image input signal into pixel grayscale data of a frame image; looking up a DeMura lookup table and DeMura control data, and performing linear interpolation on Mura designated areas of the frame image according to the DeMura lookup table and DeMura control data to obtain compensation data of the Mura designated areas of the frame image; and superposing the compensation data and the pixel grayscale data of the frame image to obtain a compensated frame image signal.

Method and device for Mura defect repair

The invention discloses a method for evaluating a brightness measurement accuracy of a Demura equipment by generating a noise-added image by adding a random number to an original grayscale image and obtaining a measurement value corresponding to the added random number via the noise-added image displayed by the Demura equipment. The brightness measurement accuracy of the Demura equipment is evaluated based on a correlation between the measured value and the originally added random number to measure a brightness extraction performance of the Demura equipment. The method provided by the invention provides a quantitative and measurable determining method that may better reflect the actual performance of the Demura equipment.

Method for evaluating brightness measurement accuracy of Demura equipment

Growing community of inventors

Wuhan, China

Zhao Liu