Nuctech Company Limited

Tsinghua University

Nuray Technology Co., Ltd

Zhanfeng Qin

Huaping Tang

Yuanjing Li

Zhiqiang Chen

Yaohong Liu

Yonggang Wang

Jinsong Pan

Ziran Zhao

Shangmin Sun

Zhuoyan Liu

Xiangyu Yin

Yangwei Zhan

Chuanxiang Tang

Huaibi Chen

Xinshui Yan

Qinghui Zhang

Xin Jin

Hua Peng

Jinyu Zhang

Chunguang Zong

Weifeng Yu

Hu Tang

Wei Jia

Jinsheng Liu

Jinning Liang

Xiying Liu

Liwei Song

Sheng Yao

A power supply circuit and a field emission electron source are provided. The power supply circuit includes: field effect transistors Scoupled in series via drains and sources in sequence, wherein 1≤i≤n, n≥2, and wherein a source of Sis coupled to a negative electrode of a voltage source, and a drain of Sis used as an output terminal of the power supply circuit to couple to a load; a first group of diodes Dcoupled in series; a first group of resistors R, 2≤j≤n; and a current feedback module configured to adjust an internal resistance of the field effect transistors S, coupled in series in sequence, so as to cause a current passing through the load to be constant; wherein the field effect transistors S, 1≤i≤n, operate in a constant current region.

Power supply circuit and field emission electron source

A power supply circuit and a field emission electron source are provided. The power supply circuit includes: field effect transistors Scoupled in series via drains and sources in sequence, 1&#x2264;i&#x2264;n, i and n are natural numbers, n&#x2265;2, and a source of Sis coupled to a negative electrode of a voltage source, and a drain of Sis used as an output terminal of the power supply circuit to couple to a load; a first group of diodes Dcoupled in series; a first group of resistors R, 2&#x2264;j&#x2264;n, and i and j are natural numbers; and a voltage control module configured to adjust an output voltage of the voltage source to cause a current passing through the load to be constant; the field effect transistors S, 1&#x2264;i&#x2264;n, operate in a resistive region.

Constant current-controlled power supply circuit and field emission electron source

A time-division multiplexing control device applied to a distributed X-ray source includes: a first switch module with a number of first switches that receive a high-voltage signal and a first control signal, selectively turning on one of the plurality of first switches according to the first control signal and sending the high-voltage signal through the first switch turned on; and a cathode control module including a plurality of cathode control stages in one-to-one correspondence with the plurality of first switches, used for receiving the high-voltage signal from the first switch module and sending working state data through a cathode control stage corresponding to the first switch turned on in the plurality of cathode control stages, where each cathode control stage includes a cathode control unit and a cathode.

Time-division multiplexing control device and system

Embodiments of the present disclosure disclose a multi-output high-voltage power supply including a channel selection circuit () including a plurality of switches; and a high-voltage power supply module () connected to the channel selection circuit (), wherein the high-voltage power supply module () includes a fine adjusting power supply component () and a plurality of coarse adjusting power supply components (-to-N) connected in series, wherein one high-voltage output terminal of the high-voltage power supply module () is connected to a common terminal of the channel selection circuit (), and the other high-voltage output terminal of the high-voltage power supply module () is grounded through a current sampling resistor.

Multi-output high-voltage power supply and distributed ray source with multi-output high-voltage power supply

An X-ray product quality automatic inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device for carrying the inspected product to pass through an X-ray radiation region; and a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector and to provides an inspection and analysis result of the inspected product according to the characteristic information.

X-ray product quality automatic inspection device

Embodiments of the present invention provide a trailed multiple-viewing-angle item inspection system and method of operating the same. The inspection system includes: a trailer vehicle, a radiation inspection device, a power supply device and a power grid connection device. The trailer vehicle is mounted with a power supply chamber within which a power supply device and a power grid connection device are mounted and an inspection chamber within which a radiation inspection device is mounted. The radiation inspection device includes: ray radiation source configured to emit X-rays from various positions, detectors, a body frame, a transfer device, a data and image process system and a display and operation device. The trailed multiple-viewing-angle item inspection system of the present invention can obtain a transmission image containing depth information of an item by its one pass through the device, and achieve a high-speed inspection, a good image quality and a high inspection efficiency of hazardous articles, and its flexibility and movability can meet requirements in various working conditions.

Trailed multiple-viewing-angle item inspection system and method of using the same

The present invention may perform fluoroscopic imaging simultaneously on the subjects in at least two channels using only one electron accelerator, at least two sets of X-ray beams and at least two sets of detector systems, through the design of the electron accelerator, the shielding and collimating device, the at least two detector arrays and various mechanical composite structures. The X-ray fluoroscopic imaging system according to the present invention may be designed in specific forms of a stationary type, an assembled type, a track mobile type or vehicular mobile type, etc., and has advantages such as simple structure, low cost, strong function, good image quality and the like.

X-ray fluoroscopic imaging system

The present invention provides a standing wave electron linear accelerator comprising a modulator and a magnetron for producing radio frequency microwaves; a plurality of accelerating tubes for accelerating electrons; a microwave transmission system for feeding the microwaves into the plurality of accelerating tubes; a plurality of electron guns for emitting electron beams into the plurality of accelerating tubes; a plurality of targets impinged by the electrons from a plurality of accelerating tubes to form continuous spectrums of X-rays; a plurality of shielding devices for shielding the continuous spectrums of X-rays generated by the targets; and a microwave distributor disposed adjacent to the end of the microwave transmission system, wherein the microwave distributor has a microwave inlet and a plurality of microwave outlets for distributing the microwaves in the microwave transmission system into the accelerating tubes.

Standing wave electron linear accelerator and container/vehicle inspection system

An X-ray product quality online inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device which is located between the distributed X-ray source and the detector for carrying the inspected product to pass through an X-ray radiation region, wherein the transport device is arranged as a continuous transport mechanism which matches a production line of the inspected product; and a power supply and control device, which is used to supply power to and control the X-ray product quality online inspection device.

X-ray product quality online inspection device

The present disclosure is directed to an electron source and an X-ray source using the same. The electron source of the present invention comprises: at least two electron emission zones, each of which comprises a plurality of micro electron emission units, wherein the micro electron emission unit comprises: a base layer, an insulating layer on the base layer, a grid layer on the insulating layer, an opening in the grid layer, and an electron emitter that is fixed at the base layer and corresponds to a position of the opening, wherein the micro electron emission units in the same electron emission zone are electrically connected and simultaneously emit electrons or do not emit electrons at the same time, and wherein different electron emission zones are electrically partitioned.

Electron source, X-ray source and device using the X-ray source

The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.

This invention relates to an X-ray goods inspection apparatus, and in particular to a goods inspection apparatus using distributed X-ray source.

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Beijing, China

Zhanfeng Qin