Samsung Electronics Co., Ltd.

Korea University Research and Business Foundation

Zephaniah Phillips, V

Joon Hyung Lee

Ki Young Chang

Jung Yong Nam

Beop Min Kim

Seung Ho Paik

A photodetector selection apparatus and method and a scattering coefficient measurement apparatus and method are provided. The photodetector selection apparatus for measuring a scattering coefficient may include: a light source configured to emit light to a subject; a photodetector array configured to detect the light that is reflected or scattered from the subject and measure a light intensity of the detected light; and a processor configured to select at least one photodetector from a plurality of photodetectors of the photodetector array, based on a change in the measured light intensity of each of the plurality of photodetectors according to a change in a scattering coefficient of the subject, and determine the scattering coefficient of the subject based on the light intensity that is measured by the selected at least one photodetector.

Growing community of inventors

Seoul, South Korea

Zephaniah Phillips, V