Globalfoundries Singapore Pte. Ltd.

Agency for Science, Technology and Research

Zeng Wang

Purakh Raj Verma

Jeoung Mo Koo

Wei Si

Raj Verma Purakh

Jinghua Teng

Shijie Wang

Bo Yu

Ming Yang

Wensheng Deng

Yuzhan Wang

Various embodiments may relate to an optical device. The optical device may include a stacked structure having a first surface and a second surface opposite the first surface. The stacked structure may include a plurality of holes or grooves extending from the first surface towards the second surface. The stacked structure may include a transition metal dichalcogenide material (TMDC) material. A thickness of the stacked structure may be of any value less than 100 nm.

Optical device and method of forming the same

A method for forming a trench capacitor without an additional mask adder and the resulting device are provided. Embodiments include forming a buried implant layer over a substrate; forming an EPI layer over the buried implant layer; forming an oxide layer over the EPI layer; forming a nitride layer over the oxide layer; forming first and second trenches in the nitride layer, the oxide layer, the EPI layer, the buried implant layer and the substrate, the first trench being wider and deeper than the second trench; forming a dielectric layer in the trenches; forming a first polysilicon layer over the dielectric layer in the trenches; removing the first polysilicon layer and the dielectric layer above the EPI layer in the trenches and at a bottom of the first trench; and forming a second polysilicon layer filling the first trench and above the EPI layer in the second trench.

Power trench capacitor compatible with deep trench isolation process

Device and method of forming a non-volatile memory (NVM) device are disclosed. The NVM device includes NVM cells disposed on a substrate in a device region. The NVM cell includes a floating gate (FG) with first and second FG sidewalls disposed on the substrate and an intergate dielectric layer disposed over the FG and substrate. Re-entrants are disposed at corners of the intergate dielectric which are filled by dielectric re-entrant spacers. An access gate (AG) with first and second AG sidewalls is disposed on the substrate adjacent to the FG such that the second AG sidewall is adjacent to a first FG sidewall and separated by the intergate dielectric layer and the re-entrant spacers prevent AG from filling the re-entrants. A first source/drain (S/D) region is disposed in the substrate adjacent to the first AG sidewall and a second S/D region is disposed in the substrate adjacent to the second FG sidewall.

Split gate non-volatile memory (NVM) with improved programming efficiency

Methods for fabricating integrated circuits are provided. In one example, a method includes depositing an ILD layer overlying a SOI substrate including a device structure and an isolation structure. The device structure is disposed on a semiconductor layer of the SOI substrate and includes a metal silicide region and the isolation structure extends through the semiconductor layer to a buried insulator layer of the SOI substrate. A patterned mask is used for etching through the ILD layer and forming a device contact opening that exposes the metal silicide region and a substrate contact opening that exposes the isolation structure. A device contact is formed in the device contact opening. The isolation structure and the buried insulator layer are etched through to extend the substrate contact opening to a support substrate of the SOI substrate. A substrate contact is formed in the substrate contact opening.

Methods for fabricating integrated circuits including substrate contacts

Growing community of inventors

Singapore, Singapore

Zeng Wang