Omnivision Technologies, Inc.

Zejian Wang

Chun-Hsiang Chang

Liping Deng

Yingkan Lin

Yu-Shen Yang

Chao-Fang Tsai

Fan Zhu

Jingwei Lai

A data transmission circuit of an image sensor. In one embodiment, the data transmission circuit includes a plurality of banks coupled in a series. A peripheral bank of the plurality of transmission banks is coupled to a function logic. Each bank includes a plurality of local buffers coupled to a local buffer control and a plurality of global buffers coupled to a global buffer control. The local buffers are settable to their enabled or disabled state by a bank enable command at the local buffer control. The enabled local buffers are configured to transfer local data to shift registers of their respective bank. The disabled local buffers are configured not to transfer the local data to the shift register of their respective bank.

Data readout power saving techniques for shift register structure

Apparatuses and methods for data transmission in an image sensor are disclosed herein. An example data transmission circuit may include a plurality of transmission banks coupled in series with a first one of the plurality of transmission banks coupled to function logic, where each of the plurality of transmission banks are coupled to provide image data to a subsequent transmission bank in a direction toward the function logic in response to a clock signal, a plurality of delays coupled in series, wherein each of the plurality of delays is associated with and coupled to a respective transmission bank of the plurality of transmission banks, and wherein the clock signal is received by each of the plurality of transmission banks after being delayed by a respective number of delays of the plurality of delays in relation to the function logic.

Image data readout circuit with shared data bus

Counters with various widths for an image sensor. An image sensor includes a plurality of image pixels arranged in rows and columns of a pixel array. A plurality of memory cells are individually coupled to corresponding columns of the pixel array. The memory cells are arranged in a memory bank. The memory bank includes a first memory cell coupled to a first column of the pixel array. The first memory cell includes a first counter having a first width. A second memory cell is coupled to a second column of the pixel array. The second memory cell comprises a second counter having a second width. The first width and the second width are different.

Counter design with various widths for image sensor

An example method for fast ramp start-up during analog to digital conversion (ADC) includes opening a feedback bypass switch coupled to an amplifier to initiate an ADC operation, providing an injection current pulse to an inverting input of the amplifier, where the non-inverting input is coupled to a feedback bypass switch, integrating a first reference current coupled to the inverting input of the amplifier, where the integrating of the first reference current occurs due to the opening of the feedback bypass switch, and providing a reference voltage in response to the injection current pulse, the integrating of the first reference current, and a reference voltage coupled to a non-inverting input of the amplifier, where a level of the reference voltage is increased at least at initiation of the ADC operation in response to the injection current pulse.

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San Jose, CA, United States of America

Zejian Wang