Jilin University

Zaizheng Yang

Hongwei Zhao

Luquan Ren

Zhichao Ma

Shuai Tong

Hongcai Xie

Jiakai Li

Chaofan Li

Junming Xiong

Wei Zhang

Zixin Guo

Guoxiang Shen

Yicheng Li

Wenyang Zhao

Boyi Kou

Jiazheng Sun

Ziyi Wu

Yifan Liu

The present invention provides a micro-nano impact indentation testing device and method based on cyclic refrigeration, and relates to the technical field of material property testing. The testing device comprises a pressure rod and a stage for low-temperature micro-nano impact indentation testing, and a refrigeration device for refrigerating and cooling the pressure rod and the stage, wherein the refrigeration device refrigerates the pressure rod and the stage by adopting an embedded channel, a cold conduction wire connected to the pressure rod and the stage and a refrigeration balancer in contact with the cold conduction wire are arranged between the pressure rod and the stage, and the temperature of the pressure rod and the temperature of the stage are stabilized at a common temperature point by the cold conduction wire and the refrigeration balancer together.

Micro-nano impact indentation testing device and method based on cyclic refrigeration

The present invention discloses a rapid dot matrix micro-nano impact indentation testing system. The rapid dot matrix micro-nano impact indentation testing system comprises a three-dimensional electric positioning module, wherein the three-dimensional electric positioning module comprises an XY translation stage and a Z-axis lifting stage; a dot matrix impact indentation module, wherein the dot matrix impact indentation module comprises a three-degree-of-freedom piezoelectric platform arranged on the Z-axis lifting stage, one surface of the three-degree-of-freedom piezoelectric platform is provided with a piezoelectric ceramic actuator, and one end of the piezoelectric ceramic actuator is connected to an indenter; a clamp, wherein the clamp clamps a test piece, and the test piece faces the indenter; and an imaging module, wherein the imaging module comprises a microscope lens. The system can achieve in-situ micro-nano impact indentation test and rapid dot matrix indentation, and has higher indentation precision.

Rapid dot matrix micro-nano impact indentation testing system

Growing community of inventors

Changchun, China

Zaizheng Yang