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Simon Fraser University

Zahava Koren

Israel Koren

Yves Audet

Glenn H Chapman

Glenn Harrison Chapman

Jozsef Dudas

Cory Jung

Methods for detecting defective pixels in imaging arrays involve establishing probabilities that individual pixels are defective and updating those probabilities by analysing images acquired by the imaging arrays. Probabilities may be evaluated for each of two or more defect conditions. The methods may be used to detect defects such as stuck-low, stuck-high, high-sensitivity, low sensitivity, hot, and defect-free conditions. Other more complicated defect conditions can also be detected. Apparatus for detecting defective pixels may be integrated with a camera or other imaging device or provided separately.

Methods and apparatus for detecting defects in imaging arrays by image analysis

An active pixel sensor imaging device comprises array of pixel cells, each pixel cell providing a pixel output signal to a signal output line associated therewith. Each pixel cell comprises: a photosensor having at least two independent portions, each independent portion having a sensor output; and, a separate readout circuit coupled to the sensor output of each independent portion. Each separate readout circuit has an output coupled to the signal output line and each separate readout circuit is capable of generating an output signal at the output. The outputs of the separate readout circuits for the pixel cell are connected such that the output signals are combined in an additive manner to produce the pixel output signal. Hardware and software correction methods are provided for the correction of defective pixels in monochromatic and color imaging systems.

Active pixel with built in self-repair and redundancy

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Amherst, MA, United States of America

Zahava Koren