X Development LLC

Yvonne Yip

Sarah Ann Laszlo

Nina Thigpen

Vladimir Miskovic

Methods, systems, and computer programs encoded on a computer storage medium, for improving EEG measurements by identifying artifacts present in EEG measurements and providing a real-time indication to a user of likely artifacts in EEG measurements are described. EEG measurements of a patient can be obtained by placing a wearable device or EEG cap on a patient's head. Sensors in the cap provide EEG data to a computing device that processes the data to identify one or more artifacts in the EEG data. The artifacts can be identified by conducting one or more operations of determining the signal to noise ratio of the line noise, calculating mutual information between sensor pairs, and applying the p-welch method. Based on the types of artifacts identified, the computing device can output an indicator that provides feedback to the technician performing an EEG test to make adjustments to the test setup.

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San Francisco, CA, United States of America

Yvonne Yip