Renishaw Plc

Yvonne Ruth Huddart

Nicholas John Weston

Andrew John Moore

Timothy Charles Featherstone

A method of putting a feature of interest on an object and an optical inspection system of a non-contact probe mounted on a positioning apparatus in a desired relationship. The method includes: a) identifying a target point of interest on the object to be inspected by arranging the non-contact probe and object at a first relative configuration at which a marker feature, projected by the non-contact probe along a projector axis that is not coaxial with the optical inspection system's optical axis, identifies the target point of interest; and b) subsequently moving the non-contact probe and/or object so as to put them at a second relative configuration at which the target point of interest and optical inspection system are at the desired relationship, in which the positioning apparatus is configured to guide such motion in accordance with the control path.

Non-contact probe and method of operation

A non-contact measurement apparatus and method. A probe is provided for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured. Also provided is an image analyzer configured to analyze at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured. The image analyzer is further configured to obtain topographical data regarding a surface of the object via analysis of an image, obtained by the probe, of the object on which an optical pattern is projected.

Non-contact probe

A non-contact method of inspecting the topography of an area of an object via analysis of the phase of a pattern projected on the object. The method includes taking a first image of the object, obtained from a first perspective, on which an optical pattern is projected, and taking a second image of the object, obtained from a second perspective, on which an optical pattern is projected but in which the optical pattern, as it falls on the object, in the second image differs to that in the first image. The method further includes determining data describing the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image. Phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image.

Non-contact object inspection

A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.

Non-contact measurement apparatus and method

A non-contact method and apparatus for inspecting an object via phase analysis. A projector projects an optical pattern onto the surface of an object to be inspected. At least first and second images of the surface on which the optical pattern is projected are then obtained. The phase of the optical pattern at the surface is changed between the first and second image by moving the projector relative to the object.

Growing community of inventors

Edinburgh, United Kingdom

Yvonne Ruth Huddart