Sun Microsystems, Inc.

Yvetta D Pols

James M Carney

Robert S Antonuccio

Daniel D Gonsalves

William A Izzicupo

Joseph M Spano

Timothy M Holland

Joseph J Montagna

Lewis B Sheen

A test fixture which holds multiple circuit boards in an edge-to-edge configuration for testing includes a sliding interconnect mechanism which is located between the circuit boards under test. The interconnect mechanism includes an interconnect board on which are mounted pairs of inter-wired frame connectors which mate with the connectors on each of the printed circuit boards to be tested and electrically interconnect the boards. The interconnect mechanism includes guide pins on which the interconnect mechanism slides to accurately align the frame and board connectors and an actuating mechanism to move the interconnect mechanism into position to securely mate the aligned connectors. The actuating mechanism can also be reversed to unmate the connectors and release the boards under test after the tests are completed.

Test fixture with quick connect and release board interconnect mechanism

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Winchester, MA, United States of America

Yvetta D Pols