Adv Antest Corporation

Asahi Kasei Homes Corporation

Yuya Watanabe

Shigeru Sugamori

Hiroaki Yamoto

Yu Nomura

Katsuhiro Tsuno

Hydroponic cultivating device

A test method for testing a device under test by using an event tester is provided. The test method includes: receiving a test signal generated by the event tester and applied to the device under test and sequentially writing the same to a memory; reading sequentially the written test signal from the memory at the speed higher than that of the test signal generated by the event tester and applying the same to the device under test; acquiring the output signal outputted from the device under test in response to the applied test signal and sequentially writing the same at the speed higher than that of the test signal generated by the event tester; sequentially reading the written output signal from the memory and transmitting the same at the speed lower than that of the output signal outputted from the device under test; and determining pass/fail of the transmitted output signal by the event tester.

Test method, test system and assist board

There is provided a test system that tests a device under test. The test system includes a test apparatus that tests the device under test on the basis of an event, and an added apparatus that is added between the device under test and the test apparatus when an interval to which a device output signal is changed is smaller than an interval capable of being processed by the test apparatus, and the added apparatus includes a signal input section that inputs the device output signal output from the device under test according to the device input signal, a change detecting section that detects whether the input device output signal has been changed or not, a change timing detecting section that detects the change timing for the device output signal, a storing section that sequentially stores the change timing and the signal value after the change for the device output signal as an output event, according to the fact that the device output signal has been changed, and a reading section that sequentially reads the output events from the storing section to input the events into the test apparatus.

Test system, added apparatus, and test method

Growing community of inventors

Tokyo, Japan

Yuya Watanabe