Hitachi Astemo Ltd.

Hitachi-high-technologies Corporation

Arai Seisakusho Co., Ltd

Yuya Suzuki

Tsuyoshi Ohnishi

Toshie Yaguchi

Takeo Kamino

Mitsuru Konno

Nozomu Sasaki

Sho Kanda

Haruki Nobori

Norihide Ouchi

Junpei Kogawa

The shape of a back-up ring is a V-shaped sectional shape. In the back-up ring, an annular concave surface part having a V-shaped sectional shape serving as a valley toward a high-pressure side is formed on a surface part on a side that faces a seal ring, and an annular convex surface part having a V-shaped sectional shape serving as a peak toward a low-pressure side is formed on a surface part opposite to the side that faces the seal ring. When a high pressure is applied from a high-pressure side, the back-up ring is deformed such that V-shaped angles of an annular concave surface part and an annular convex surface part are increased as the annular concave surface part is pressed against the seal ring, and is brought into close contact with a housing and a shaft.

Sealing apparatus

In an electromagnetic fuel injection valve, a plurality of recess parts are provided in an attracted face of a movable core, the recess parts dividing a taper face of the movable core into a plurality of sections along a peripheral direction of the movable core. Accordingly, a fuel oil film present in an engaged part between an annular projection of a fixed core and the taper face is sectioned at a plurality of locations, thereby suppressing a sticking phenomenon of the engaged part caused by the fuel oil film. Therefore, when energization of a coil is cut off, a delay in detachment of the movable core from the fixed core is eliminated, thus contributing to improvement of valve-closing responsiveness.

Electromagnetic fuel injection valve

A focused ion beam system capable of acquiring surface structure information, internal structure information, and internal composition information about a sample simultaneously from the same field of view of the sample. A method of sample preparation and observation employs such focused ion beam system to accurately set a sample processing position based on information about the structure and composition of the sample acquired from multiple directions of the sample, and to process and observe the sample. The system includes, in order to acquire the sample structure and composition information simultaneously, a secondary electron detector, a transmission electron detector, and an energy dispersive X-ray spectroscope or an electron energy loss spectroscope, and employs a stub having the sample rotating and tilting function. The method includes a marking process.

Focused ion beam system and a method of sample preparation and observation

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Hitachinaka, Japan

Yuya Suzuki