Olympus Corporation

Yuya Miyazono

Shinichi Hayashi

Tatsuo Nakata

Daisuke Nishiwaki

Kenichi Kusaka

A microscope includes: a light source, an objective, a varifocal optical system that is arranged on an illumination light path between the objective and the light source, a reflection optical system that deflects an illumination light axis of the illumination light toward an optical axis of the objective, and a rotator that rotates the objective and the reflection optical system around a rotation axis that is orthogonal to the optical axis of the objective.

Microscope

A scanning microscope includes a scanner, an objective irradiates a sample with illumination light deflected by the scanner, and a beam splitter that is arranged between the objective and an exit pupil position, and that reflects one of the illumination light and observation light from the sample and transmits the other. The objective has the exit pupil position outside the objective.

Scanning microscope

A spectroscopic detection device including: a stop in which an aperture is formed; a first and second photodetectors which detect detection light; a collimator which converts the detection light emitted from the stop into substantially parallel light, and emits light to at least one of the first and second photodetectors; a dispersive element which is arranged between the collimator and the first photodetector, and disperses the detection light; a condensing optical system which condenses the detection light dispersed by the dispersive element to the first photodetector; and a wavelength selection filter which is arranged between the collimator and the second photodetector, and allows light in a specified wavelength range to enter the second photodetector. The collimator is configured so that the focal length for the detection light emitted to the first photodetector may be different from the focal length for the detection light emitted to the second photodetector.

Spectroscopic detection device and confocal microscope

A spectroscopic detector includes a spectroscopic element for dispersing light, a photodetector for detecting the light dispersed by the spectroscopic element and a condensing optical system for condensing the dispersed light to the photodetector and compensating for a deviation in a detected wavelength deriving from nonlinearity of the angle of emergence generated in the spectroscopic element through chromatic aberration of magnification.

Spectroscopic detector

A scanning microscope is provided with a scan unit that scans a sample, the scanning microscope including: a transmissive VPH grating for dispersing light from the sample; and a photodetector for detecting the light diffracted by the VPH grating.

Growing community of inventors

Tokyo, Japan

Yuya Miyazono