Hamamatsu-photonics K.k.

Yuuya Washiyama

Akio Suzuki

Masahiro Hayashi

Katsutoshi Nonaka

Etsuo Iizuka

Hiroshi Kobayashi

Sayaka Takatsuka

Masahiko Iguchi

Yuto Yanagihara

An ion detector according to this embodiment has a structure for reducing influences of signal reflection or the like on an output signal. The ion detector comprises an electron multiplier, a signal output unit, a signal output terminal, and an AC coupler. The AC coupler is disposed on a signal line between the signal output unit and the signal output terminal, including a resin sheet and a pair of conductive sections facing each other with the resin sheet interposed therebetween. One conductive section is electrically connected to an output terminal of the signal output unit, and the other conductive section is electrically connected to the signal output terminal.

Ion detector

In a charged particle detecting apparatusfor which an MCP is sandwiched with an IN electrodeand an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrodeare arranged further inside than the IN electrodewhen viewed from an MCP incident surface, and the charged particle detecting apparatusis fixed by screwing and the like to a cabinet wall surfaceof a TOF-MS by using a flange portion provided at a part of IN electrodeprojected further outside than the rear component members.

Time of flight mass spectrometer and charged particle detector therefor

In an MCP assemblyhaving one or a plurality of MCPssandwiched with an input-side electrodeand an output-side electrode, there provided at the surface facing the MCPof at least either (preferably, both) of the input-side electrodeand the output-side electrode, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.

Micro channel plate assembly

The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor. In particular, the first electrode is arranged so as to become a part of the outer surface of the charged-particle detecting apparatus, and components positioned between the first electrode and the rear cover have contours with section sizes equal to or smaller than that of the contour of the first electrode when viewed from the first electrode side toward the rear cover.

Charged-particle detecting apparatus

The present invention relates to an MCP unit or the like having a structure intended to achieve a desired time response characteristic, without depending on a limitation imposed by a channel diameter of MCP. The MCP unit comprises the MCP for releasing secondary electrons internally multiplied in response to incidence of charged particles, an anode arranged in a position where the secondary electrons reach, and an acceleration electrode arranged between the MCP and the anode. In particular, the acceleration electrode includes a plurality of openings which permit passing of the secondary electrons migrating from the MCP toward the anode. Further, the acceleration electrode is arranged such that the shortest distance B between the acceleration electrode and the anode is longer than the shortest distance A between the MCP and the acceleration electrode. Thus, an FWHM of a detected peak appearing in response to the incidence of the charged particles is remarkably shortened.

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Hamamatsu, Japan

Yuuya Washiyama