Hitachi, Ltd.

Hitachi Vlsi Engineering Corp.

Yuuji Shirai

Kanji Otsuka

Takayuki Okinaga

Takashi Emata

Hiromichi Suzuki

Gen Murakami

Hajime Hasebe

Osamu Horiuchi

Takeo Yamada

Mitsuo Usami

Akira Yamagiwa

Hitoshi Matsushima

Tadakatsu Nakajima

Shigeo Ohashi

Motohiro Sato

Toshio Hatada

Heikichi Kuwahara

Hiroshi Inouye

Shigeo Kuroda

Takao Ohba

Masao Kato

Kunizo Sahara

Seiji Miyamoto

Takashi Kumagai

Hiroshi Tachi

Shouji Matsugami

Kazutoshi Kubo

Masayuki Kawashima

Hiroshi Koguma

A cooling apparatus for an electronic device of high calorific density including an elastomer interposed between a semiconductor chip and a heat sink so as to connect them thermally. The elastomer may also be in close contact with a large number of semiconductor chips having various configurations which are mounted on a board, so that the elastomer is thermally connected with them, whereby the elastomer absorbs thermal deformations.

Cooling apparatus of electronic device

A semiconductor device is provided having a semiconductor pellet that is arranged on a substantially central part of a film base in which a metal plate is overlaid with an insulating member, while inner leads are arranged on a peripheral part of the film base in a state in which they are electrically isolated from the metal plate of the film base. External terminals for a power source among external terminals of the semiconductor pellet and middle parts of the metal plate of the film base, as well as inner leads for the power source among the inner leads and peripheral parts of the metal plate are electrically connected by pieces of bonding wire, respectively.

Semiconductor device and method of producing the same

Attempts have been made to increase the number of pins of packages accompanying the trend toward fabricating integrated circuits highly densely and in smaller sizes. The present invention provides technology for improving reliability in fabricating packages of the surface-mounted type that have increased number of pins. That is, when the packages are mounted on the wiring substrate, the lead pins that receive load from the axial direction exhibit bending strength which is smaller than the junction strength of solder at the junction portions. To achieve this object, the lead pins are made of a material having large resiliency such as a fiber-reinforced material, a transformation pseudo elastic material, an ultra-high tension material, or a heat-resistant ultra-high tension material.

Semiconductor device having leads for mounting to a surface of a printed

A semiconductor device comprising the fact that a semiconductor pellet is arranged on a substantially central part of a film base in which a metal plate is overlaid with an insulating member, while inner leads are arranged on a peripheral part of the film base in a state in which they are electrically isolated from the metal plate of the film base, and that external terminals for a power source among external terminals of the semiconductor pellet and middle parts of the metal plate of the film base, and inner leads for the power source among the inner leads and peripheral parts of the metal plate are electrically connected by pieces of bonding wire, respectively.

A semiconductor chip package technology which uses thin film wiring from the chip to the package terminals for increased line density and decreased parasitic capacitance and uses a thin film adhesion layer for improved heat conductivity between the package substrate and its sealing cap. The package uses a thin conductor film deposited along the element mounting surface of a sintered substrate. An adhesion layer, to provide a high quality bond between the sealing cap and substrate, is then deposited on the substrate peripheral area by successively laminating metal and metallized layers, or by depositing a single layer of low metal glass. The adhesion layer is thinner and of larger area than thick film technology, for improved heat conduction.

Semi-conductor device

Growing community of inventors

Kodaira, Japan

Yuuji Shirai