Sony Corporation

Tokyo Electron Limited

Kabushiki Kaisha Toshiba

Yuuichi Abe

Masahiro Suzuki

Kenji Yoshida

Ryoki Honjo

Yasuo Nakano

A control apparatus is provided, which includes: a processor; and a memory device that stores instructions to be executed by the processor, the memory device including a determination section that determines a control command according to sensor information, on the basis of a control rule capable of being set by a user for determining the control command controlling a device, and a control section that controls the device in accordance with the control command determined by the determination section, wherein the control rule specifies a first stage and a second stage, the first stage outputting a plurality of independent first values based on a plurality of first input values from a plurality of different types of sensors, and the second stage outputting a command if a second value based on the plurality of first values meets a predetermined condition.

Control apparatus, control method, program and system

A charge control device including: a charge control unit configured to select a power storage device to be charged from a plurality of power storage devices in accordance with degrees of subsequent deterioration of the power storage devices, the degrees being calculated based on battery information of the power storage devices each having a secondary battery; and a transmission unit configured to transmit a charge command to a power storage device selected by the charge control unit.

Charge control device, charge control method, program, and system

A control apparatus is provided, which includes: a determination section that determines a control command according to sensor information, on the basis of a control rule capable of being set by a user for determining the control command controlling a device; and a control section that controls the device in accordance with the control command determined by the determination section.

A power storage device including: a secondary battery; an acquisition unit that acquires charging period information for charging the secondary battery; and a charge control unit that calculates a charging power on the basis of the charging period information and controls charging power used for charging the secondary battery so that of the charging power is equal to the calculated charging power.

Power storage device, power storage method, and program

A hard disk includes: a plurality of servo areas which are elongated radially from a center of the hard disk to an outward thereof over tracks thereof; and a plurality of data areas which are respectively provided between the plurality of servo areas; wherein alternative operation is conducted per servo sector containing one of the plurality of servo areas and a data area provided subsequent to the one of the plurality of servo areas and having a defect created therein when a user sector containing at least a portion of the data area and functioning as an access unit has the defect therein.

Hard disk, control unit for a disk device, and method for controlling a disk device

A probe apparatus comprises a housing, a probing mechanism arranged in the housing and including a supporting table for supporting an object having electrodes and movably arranged to locate the object at a measurement position, and probes which is brought into contact with the respective electrodes of the object supported by the supporting table, a load/unload mechanism arranged in the housing, for loading/unloading the object in/from the supporting table, and a downflow forming unit for forming a downflow of clean air flowing from an upper position to a lower position of the housing in every region inside the housing.

Probe apparatus for carrying away dust created by probe testing

A method of the probing test comprising the steps of detecting a first scribe line of chips in a wafer, calculating a first center line of said first scribe line on the basis of the resultant, detecting a second scribe line intersecting the first scribe line, calculating a second center line of said second scribe line on the basis of the resultant, calculating a crossing point of the first and second center lines, identifying a reference pad of a first chip at predetermined position by referring to the crossing point, positioning a reference probe, which has a predetermined positional relationship with the crossing point, at the reference pad on the first chip, moving the test object. Therefore, each of the pads is respectively contacted with each of the probes.

Growing community of inventors

Tokyo, Japan

Yuuichi Abe