Kabushiki Kaisha Toshiba

Sony Corporation

Ajinomoto Co., Ltd.

Yutaka Okamoto

Hideo Ando

Chosaku Noda

Yutaka Kashihara

Yoshiyuki Tanaka

Tomoharu Tanaka

Riichiro Shirota

Yoshihisa Iwata

Hideo Kato

Seiichi Aritome

Masamichi Asano

Yasuo Itoh

Hiroto Nakai

Masaki Momodomi

Kaoru Tokushige

Hideko Odaira

Takashi Mori

Koichi Hirayama

Yuji Sakai

Hiroshi Nakamura

Koji Sakui

Tetsuya Kaneko

Shinichi Ito

Makoto Yamada

Minoru Ishida

Hirofumi Sumi

Toru Nakamura

Mitsuhiro Omura

Kazunori Ohuchi

Keisuke Kikutani

Hideko Oodaira

Kazushi Tanimoto

Kazuhiro Hasegawa

Chiaki Sano

Atsushi Horiuchi

Kazuhiro Tajima

Kinzo Iitani

Manabu Akamatsu

Jun Suenaga

Naoya Noshi

Masataka Shinguu

A first silicon containing film, an organic material film, a second silicon containing film are formed. The second silicon containing film is patterned to have a narrow width pattern and a wide width pattern. The organic material film is patterned to have a narrow width pattern and a wide width pattern. A side wall is formed on a side surface of the second silicon containing film and the organic material film by coating with a third silicon containing film. The narrow width pattern of the second silicon containing film is removed by using a mask that covers the second silicon containing film patterned to have a wide width pattern and the side wall. Finally, the organic material film is removed.

Semiconductor device manufacturing method

A reproduction signal evaluation method of this invention includes the step of obtaining a reproduction signal from an information recording medium on which digital information is recorded with record marks having different sizes, the step of obtaining the amplitude of a first reproduction signal, of the signals contained in the reproduction signal, which reflects digital information recorded with a record mark having the maximum size, the step of obtaining the amplitude of a second reproduction signal, of the signals contained in the reproduction signal, which reflects digital information recorded with a record mark having the second smallest size, the step of obtaining an evaluation value from the ratio of the amplitudes of the first and second reproduction signals, and the step of evaluating a characteristic of the reproduction signal on the basis of the evaluation value.

Reproduction signal evaluation method

A signal can be detected based on a level slice system and detection delay time can be reduced by setting the recording density of a header field in a linear direction lower (coarse) than that of a user data recording field. Further, a signal can be detected based on the level slice system and detection delay time can be reduced by using a mark position form having a large detection margin as an information recording system of the header field. A readout error of a sector number due to a detection error is compensated for by recording address marks AM for attaining byte synchronization of the header field in both of a head portion and tail portion of information recorded in the header field.

Optical disk, optical disk recording method and optical disk apparatus

Growing community of inventors

Chofu, Japan

Yutaka Okamoto