Omron Corporation

Omron Tateisi Electronics Co.

Yutaka Kato

Shingo Inazumi

Yutaka Kiuchi

Jaewook Hwang

Yuji Suzuki

Yasuyuki Ikeda

Yoshihisa Minato

Yasuhito Uetsuji

Kiyoshi Imai

Shiro Fujieda

Sakon Yamamoto

Koji Shimada

Ryohei Tanaka

Masashi Kurita

Kosuke Watanabe

Norikazu Tonogai

Yuki Hanzawa

Toyoo Iida

Yukiko Yanagawa

Takeshi Yoshiura

Naoya Nakashita

Hitoshi Nakatsuka

Toshimichi Masaki

Yuichi Doi

Shohei Nakaoka

Shigenori Nagae

Kazushi Yoshioka

Tomohiro Arano

Yuki Hasegawa

Toshiyuki Sakanaga

Takaaki Odake

Akinobu Kitamura

An inspection apparatus according to one or more embodiments extracts an attention area from a target image using a first estimation model, performs a computational process with a second estimation model using the extracted attention area, and determines whether a target product has a defect based on a computational result from the second estimation model. The first estimation model is generated based on multiple first training images of defect-free products in a target environment. The second estimation model is generated based on multiple second training images of defects. The computational process with the second estimation model includes generating multiple feature maps with different dimensions by projecting the target image into different spaces with lower dimensions. The extracted attention area is integrated into at least one of the multiple feature maps in the computational process with the second estimation model.

Inspection apparatus, unit selection apparatus, inspection method, and computer-readable storage medium storing an inspection program

An image sensor includes an imaging device, an optical system including a liquid lens, a temperature sensor that detects a temperature of the liquid lens, a heater that heats the liquid lens, a temperature adjuster that controls the heater to adjust the temperature of the liquid lens to a predetermined temperature, a nonvolatile memory storing property information about the liquid lens, a refractive power controller that determines, based on a target refractive power and the property information stored in the nonvolatile memory, an application voltage applicable to the liquid lens adjusted to have the predetermined temperature and applies the application voltage to the liquid lens to control a refractive power of the liquid lens to match the target refractive power, and an image processor. The optical system, the nonvolatile memory, and the temperature sensor are disconnectable from a body module including the refractive power controller and the image processor.

Image sensor

An image inspection apparatus includes: an image capturing unit which captures images of an object; a transparent illumination unit which has a light-emitting surface which radiates light to the object and is configured to be able to control a light-emitting position on the light-emitting surface and a radiation direction of the light; and a control unit which is configured to control the image capturing unit and the illumination unit. The control unit causes the illumination unit to change the light-emitting position and the radiation direction, causes the image capturing unit to capture images of the object, identifies a light-emitting position and a radiation direction of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object, and calculates a distance to the measurement point on the basis of the identified light-emitting position and the identified radiation direction.

Image inspection apparatus and image inspection method

An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.

Image inspection device and lighting device

The image inspection apparatus includes an image capturing unit which captures images of an object, a transparent illumination unit disposed between the object and the image capturing unit, and a control unit configured to control the image capturing unit and the illumination unit. The illumination unit radiates light to the object in a first direction and causes the light to scan and radiates light to the object in a second direction and causes the light to scan. The image capturing unit captures images of the object. The control unit identifies a light-emitting position of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object captured, and calculates a distance to the measurement point on the basis of the identified light-emitting position, the first direction and the second direction.

Provided is an image processing device which has: an image input part configured to input a multi-spectral image which includes N (N is an integer of 4 or more) channels corresponding to N bands; a reference vector setting part configured to cause a user to set, as three reference vectors, three types of N-dimensional vectors having sensitivities of the respective N bands as elements; and a conversion part configured to convert the multi-spectral image into a 3-channel image including three channels by decomposing a spectral distribution of each pixel of the multi-spectral image on the basis of the three reference vectors.

Image processing for converting multi-spectral image by calculating the inner product of the spectral distribution of each pixel and the respective reference vector

An illumination device includes illumination units for irradiating light on an object and a substrate member, which is an example of a holding mechanism for detachably holding the illumination units according to a predetermined disposition rule. The substrate member has a connection part for electrically connecting with a controller. The substrate member holds a part of the illumination units by linking parts.

Illumination device, illumination unit, and image processing system

To provide an appearance inspection system capable of reduce labor for setting an imaging condition by a designer when a plurality of inspection target positions on a target is sequentially imaged. An appearance inspection system includes an imaging condition decision part and a route decision part. The imaging condition decision part decides a plurality of imaging condition candidates including a relative position between a workpiece and an imaging device for at least one inspection target position among a plurality of inspection target positions. The route decision part decides a change route of an imaging condition for sequentially imaging the plurality of inspection target positions by selecting one imaging condition among the plurality of imaging condition candidates so that a pre-decided requirement is satisfied.

Appearance inspection system, setting device, image processing device, inspection method, and program

The disclosure provides an appearance inspection system that can reduce subject blurring when an object is imaged while changing a relative position of an imaging device with respect to the object. A first control unit causes the imaging device to perform imaging when the imaging device reaches an imaging position corresponding to the inspection target position. A second control unit changes at least one of the position and the orientation of the imaging device in a direction in which a relative movement between a field of view of the imaging device and the inspection target position according to the change in the relative position along a designated path is canceled out during a predetermined period including a time point at which the imaging device reaches the imaging position.

Appearance inspection system, setting device, and inspection method

An appearance inspection system includes a setting part, a movement mechanism, and a control part. The setting part sets a route passing through a plurality of imaging positions in order. The setting part sets the route so that a first time necessary for the movement mechanism to move an imaging device from a first imaging position to a second imaging position among the plurality of imaging positions is longer than a second time necessary for a process of changing a first imaging condition corresponding to the first imaging position to a second imaging condition corresponding to the second imaging position by the control part. The control part starts the process of changing the first imaging condition to the second imaging condition earlier by the second time or more than a scheduled time at which the imaging device arrives at the second imaging position.

Appearance inspection system, image processing device, imaging device, and inspection method

An image inspecting apparatus includes at least one image capturing part, a lighting part, a control part including a moving part, a searching part analyzing an image captured by the image capturing part under a first image capturing condition and searching for a defect candidate from an object under inspection, and a determining part. When the searching part finds the defect candidate from the object under inspection, the control part controls an image capturing condition such that a part where the defect candidate is found by the searching part is photographed under a second image capturing condition that is clearer than the first image capturing condition. The determining part analyzes an image captured by the image capturing part under the second image capturing condition and determines whether the defect of the object under inspection is present or absent.

Image inspecting apparatus, image inspecting method and image inspecting program

An image inspection device which can image an object with a plurality of cameras in a state in which the object is optimally illuminated and which can also be downsized is provided. The image inspection device includes a plurality of imaging parts that image the object, an illumination part that is disposed between the object and the plurality of imaging parts and radiates light toward the object and has a light-transmissive property, and a control part that controls the plurality of imaging parts and the illumination part. The illumination part includes a plurality of illumination elements which are arranged in a matrix and are allowed to be turned on independently. The control part controls the plurality of illumination elements to cause the illumination part to illuminate a region of the object corresponding to a field of view of the plurality of imaging parts.

Image inspection device

Provided are an image inspection device and an illumination device capable of thinning and downsizing the illumination device. An image inspection device includes a photographing part photographing an object, a light transmissive illumination part, and an optical member. The illumination part is arranged between the object and the photographing part and has a light emitting surface arranged to face the object. The optical member is arranged on the light emitting surface of the illumination part and transmits light emitted by the illumination part toward the object. The optical member includes a plurality of optical regions. The optical regions are arranged so as to surround a central region of the light emitting surface centered on an optical axis of the photographing part, and are configured to emit light having mutually different color characteristics toward the object.

Image inspection device and illumination device

The disclosure provide an image inspection device and an illumination device. The image inspection device includes a photographing part; an illumination part including a light guide plate disposed at any position between the object and the photographing part; and a control part. The illumination part includes a first light emitting part and a second light emitting part disposed around the light guide plate; and a first reflective part and a second reflective part. The reflective parts are configured so that a light emitting surface of the light guide plate has an emission intensity distribution of a first pattern when the first light emitting part emits light under control of the control part, and the light emitting surface has an emission intensity distribution of a second pattern different from the first pattern when the second light emitting part emits light under control of the control part.

An image processing system, an image processing device and an image processing method that can improve performance of an image measurement are provided. A control device controls a light emission portion in a manner that each of plural types of partial regions set on a light emission surface emits light, and controls a camera to image an object in synchronization with light emission of each of the plural types of partial regions. The control device performs an image measurement of the object based on reflection profile information which is generated based on a plurality of input images, and the reflection profile information shows a relationship between positions within the light emission surface and degrees of light reflected at attention sites of the object and incident to the camera with respect to light irradiated from the position to the object.

Growing community of inventors

Kyotanabe, Japan

Yutaka Kato