Fuji Electric Co., Ltd.

Yuta Sunasaka

Tadanori Yamada

Ryu Araki

Michio Tamate

Hiroki Katsumata

Miwako Fujita

Tamiko Asano

Yuhei Suzuki

Takashi Kaimi

Bao Cong Hiu

The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.

Evaluation method, combined evaluation method, evaluation apparatus, and combined evaluation apparatus

The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method and an evaluation apparatus are provided, including: causing a semiconductor device to perform a switching operation; measuring voltage variation occurring between main terminals of the semiconductor device during the switching operation; and outputting an evaluation benchmark for radiated noise of the semiconductor device based on the voltage variation. The outputting the evaluation benchmark may include calculating the voltage variation in the semiconductor device for each frequency component as the evaluation benchmark.

Evaluation method, estimation method, evaluation apparatus, and combined evaluation apparatus

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Fukuoka, Japan

Yuta Sunasaka