Omron Corporation

Kyoto University

Yuta Kamikawa

Atsushi Hashimoto

Yoshitaka Ushiku

Motoharu Sonogashira

Masaaki Iiyama

A model generation apparatus according to one aspect of the present invention acquires a plurality of learning datasets each constituted by a first sample of a first time of predetermined data obtained in time series and feature information included in a second sample of the predetermined data of a future second time relative to the first time, and trains a prediction model, by machine learning, to predict feature information of the second time from the first sample of the first time, for each learning dataset. In the model generation apparatus, a rarity degree for is set each learning dataset, and, in the machine learning, the model generation apparatus trains more preponderantly on learning datasets having a higher rarity degree.

Growing community of inventors

TOKYO, Japan

Yuta Kamikawa