Kabushiki Kaisha Toshiba

Yuta Itoh

Satoshi Ito

Akihito Seki

Masaki Yamazaki

Kenichi Shimoyama

Ryuzo Okada

Hideaki Uchiyama

According to an embodiment, a measuring device includes a projector, an image capturing unit, and a first calculator. The projector projects, onto a target, a first superimposed pattern which is obtained by superimposing a first pattern having a periodic change and a second pattern configured with a first design for specifying a period of the first pattern. The image capturing unit captures the target, onto which the first superimposed pattern is projected to obtain an image. The first calculator performs matching of the first design taken by the image capturing unit, which is included in the first superimposed pattern in the image, with the first design projected by the projecting unit, and calculates correspondence between a second superimposed pattern, which points to the first superimposed pattern captured in the image, and the first superimposed pattern.

Measuring device, measuring method, and computer program product

An area identifying device includes a projecting unit, an image capturing unit, a calculating unit, and an identifying unit. The projecting unit is configured to project a pattern so that the pattern performs a predetermined movement. The image capturing unit is configured to capture, in sequential order, multiple images of a projection area on which the pattern is projected, each image including a plurality of image areas. The calculating unit is configured to calculate an amount of change of pattern appearances for each image area in the multiple images. The identifying unit is configured to identify, as a reflective area, at least one image area having a different amount of change of the pattern appearances from a reference amount of change of the pattern appearances based on the predetermined movement, among the calculated amounts of change of the pattern appearances.

Device, method, and computer readable medium for area identification using motion from a projected pattern

According to an embodiment, a measuring device includes a measuring unit, a capturing unit, an estimation unit, a calculator, and a detector. The estimation unit estimates, for each irradiated point, an estimated projection position on the image, using a direction and a distance of the irradiated point and calibration information based on calibration of a measuring unit and a capturing unit. The calculator calculates, for each irradiated point, an amount of change in reflection intensity and obtains a reflection intensity change point. The calculator calculates, for each estimated projection position, an amount of change in brightness and obtains a brightness change point. The detector detects a calibration shift between the measuring unit and the capturing unit by comparing the reflection intensity change point and the brightness change point.

Measuring device, method, and computer program product

According to an embodiment, an identification device includes a controller, an acquiring unit, and an identifying unit. The controller controls turning on/off of a plurality of light emitting apparatuses via a network individually by using pieces of identification information of their respective light emitting apparatuses. The acquiring unit acquires images of the light emitting apparatuses in time-series. The identifying unit determines an installation position of each of the light emitting apparatuses by using the on/off control on the light emitting apparatuses and the images, and identifies each of the light emitting apparatuses determined by the installation positions corresponding to each of the light emitting apparatuses identified by the pieces of identification information with each other.

Identification device, method and computer program product

An example three-dimensional model generating device includes an emitting unit that emits a laser light and a first deflector that deflects laser light, whose emission direction rotates in a first rotation range, within a first scan plane. A second deflector deflects laser light, whose emission direction rotates in a second rotation range, within a second scan plane intersecting with the first scan plane. The detector detects a reflected light when laser light deflected from the first deflector is reflected from the target object or detects a reflected light when laser light deflected from the second deflector is reflected from the target object. The measuring unit measures a distance to the target object on the basis of the time taken since emission of the laser light to detection of the reflected light. The generating unit generates a three-dimensional model of the target object by using the measurement result.

Growing community of inventors

Kanagawa, Japan

Yuta Itoh