Panasonic Intellectual Property Management Co., Ltd.

Panasonic Corporation

Hitachi Zosen Corporation

Yusuke Okada

Sanzo Ugawa

Takeo Azuma

Taro Imagawa

Yoshiaki Satou

Yasuo Miyake

Takeyoshi Tokuhara

Kazuko Nishimura

Sanshiro Shishido

Hiroyoshi Komobuchi

Hidenari Kanehara

Yoshimasa Miura

Takeshi Matsui

Norihiro Aoki

Ryozo Shiji

Seiichi Nakai

Motonori Ishii

Shigetaka Kasuga

An imaging device is provided with a pixel array section including multiple pixels arranged in a matrix of rows and columns, and a column signal processor. The multiple pixels include multiple imaging pixels that each output a pixel signal corresponding to incident light and multiple reference pixels which are aligned in the column direction in at least two columns and which each output a reset signal corresponding to the output signal at reset of each of the multiple first pixels. The column signal processor outputs the difference between the pixel signal outputted by one imaging pixel from among the multiple imaging pixels and a reference signal based on the reset signals outputted by at least two reference pixels, from among the multiple reference pixels, located in the same row as the one imaging pixel.

Imaging device

An imaging deviceincludes a pixel array PA. A first period, a third period, and a second period appear in this order in a first frame. During the first period, pixel signal readout is performed on a first row in the pixel array PA. During the second period, pixel signal readout is performed on a second row in the pixel array PA. Each of the first period and the second period is a high-sensitivity exposure period. The third period is a low-sensitivity exposure period.

Imaging device and imaging method for obtaining a high-sensitivity image

An imaging device includes an imaging unit including a plurality of pixels, respectively including photoelectric converters and charge accumulation nodes that accumulate signal charge. The imaging unit outputs image data based on signals corresponding to the signal charge accumulated in the charge accumulators. The imaging device includes an image processing unit that processes the image data output by the imaging unit. The imaging unit sequentially outputs a plurality of pieces of image data in one frame period by performing readout nondestructively. The image processing unit generates difference image data by determining a difference between two pieces of image data, selects output image data from initial image data and the difference image data, and combines the output image data and normal readout image data included in the plurality of pieces of image data, to generate combination-result image data.

Imaging device and image processing method

An imaging device including: a first pixel and a second pixel that are arranged along a first direction, the first pixel and the second pixel each including a photoelectric converter that converts light into a charge, a charge accumulator that accumulates the charge, and a first transistor one of a source and a drain of which is connected to the charge accumulator; a first line and a second line that each extend along the first direction; first voltage supply circuitry that is connected to the first transistor of the first pixel through the first line; and second voltage supply circuitry that is connected to the first transistor of the second pixel through the second line.

An imaging deviceincludes a pixel array PA. A first period, a third period, and a second period appear in this order in one frame. During the first period, pixel signal readout is performed on at least one first row in the pixel array PA. During the second period, pixel signal readout is performed on at least one second row in the pixel array PA. At least one of the at least one first row or the at least one second row includes two rows in the pixel array PA. During the third period, no pixel signal readout is performed on the rows in the pixel array PA. Each of the first period and the second period is one of the high-sensitivity exposure period and the low-sensitivity exposure period. The third period is the other of the high-sensitivity exposure period and the low-sensitivity exposure period.

Imaging device and imaging method

An imaging device includes: a photoelectric converter including a first electrode, a second electrode, and a photoelectric conversion layer that generates a signal charge; a charge accumulator connected to the first electrode to accumulate the signal charge; a first voltage supply circuit connected to the second electrode and that selectively supplies at least two different voltages including a first voltage and a third voltage greater than the first voltage; and a second voltage supply circuit that is connected to the charge accumulator via capacitance and that selectively supplies at least two different voltages including a second voltage and a fourth voltage less than the second voltage, where in a first period in which the first voltage supply circuit supplies the first voltage, the first period being included in an accumulation period for accumulating the signal charge in the charge accumulator, the second voltage supply circuit supplies the second voltage.

Imaging device and drive method therefor

An imaging device includes: a first pixel and a second pixel that are arranged along a first direction and each include a photoelectric converter, a charge accumulator, a first transistor one of a source and a drain of which is connected to the charge accumulator, and a second transistor a gate of which is connected to the charge accumulator; a first line and a second line that each extend along the first direction; a first voltage supply circuit configured to generate a voltage between a first voltage turning on the first transistor of the first pixel and a second voltage turning off the first transistor of the first pixel; and a second voltage supply circuit configured to generate a voltage between a fourth voltage turning on the first transistor of the second pixel and a fifth voltage turning off the first transistor of the second pixel.

An imaging apparatus including: a solid-state imaging device including pixels arranged in rows and columns, the device including: an OB pixel unit including rows of light-shielding pixels among the pixels; and a valid pixel unit including pixels allowing light from the subject to enter among the pixels; an exposure control unit which exposes the second pixel unit; a read line selecting unit which sequentially selects one or more pixel rows of the OB pixel unit, at different timings during exposure of the valid pixel unit, and causes each of pixels of the one or more pixel rows to output a pixel signal; and a dark charge measuring unit which measures the quantity of dark charge due to dark current of the device using current ones of pixel signals, each time pixel signals are output from the OB pixel unit through the selection by the read line selecting unit.

Imaging apparatus and dark charge measuring method

In an embodiment, a solid-state image sensor comprises: pixels arranged in columns and rows; read signal lines each connected to pixels arranged in a row direction; and output signal lines each connected to pixels arranged in a column direction. The read signal lines are classified into a first type of read signal lines each connected to a group of pixels on which R and B rays are incident, and a second type of read signal lines each connected to a group of pixels on which G rays are incident. Two pixels (R, B) on two adjacent columns are arranged on two opposite sides with respect to the first type of read signal line. Two pixels (Gr, Gb) on two adjacent columns are arranged on two opposite sides with respect to the second type of read signal line.

Solid-state image capture element and image capture device comprising said solid-state image capture element, and image capture control method and image capture control program

In an embodiment, an image sensor includes pixels arranged in columns and rows, read signal lines connected to pixels arranged in the row direction. Each pixel is read in either a first exposure time or in a second exposure time shorter than the first exposure time. Each of a first type of read signal lines is connected to a group of pixels associated with the first exposure time, and each of a second type of read signal lines is connected to a group of pixels associated with the second exposure time. In two vertically adjacent horizontal pixel lines, the first type of read signal line is shared by two horizontally adjacent pixels associated with the first exposure time, and the second type of read signal line is shared by two horizontally adjacent pixels associated with the second exposure time.

Solid-state image sensor and image capture device including the sensor

The image generation device generates a new moving picture of a subject based on first and second moving pictures shot with a single-chip color image sensor, which detects two light rays including first and second color components, respectively, to represent the first and second color components of the subject. As the first moving picture has been shot in a longer exposure time than the second moving picture, the first picture has a lower frame rate than the second picture. The image generation device includes: a getting section which gets video signals representing the first and second moving pictures, respectively; a processing section which generates a new moving picture with as high a frame rate as the second moving picture based on the respective video signals representing the first and second moving pictures gotten; and an output section which outputs the new moving picture.

Image generation device and image generation system, method and program

A solid-state imaging device includes an imager including pixels arranged in a matrix, and analog to digital (AD) converters, each of which is provided in each pixel column and converts a signal voltage read from one of the pixels located in the column to a digital value. Each of the AD converters includes a comparator and a counter section including a counter circuit, which receives a comparison result of the comparator and includes a first D flip-flop (DFF) for n-bits, and a transfer circuit, which includes a second DFF for n-bits holding and outputting a count value of the counter circuit. The second DFFs provided in the columns are coupled in series to form a transfer section transferring the signal voltage which has been digitally converted.

Solid-state imaging device including analog-to-digital converter and analog-to-digital conversion method

An image capture device according to the embodiment of the present invention includes an image capture sectionfor reading a pixel signal of a first color component at a low frame rate and reading a pixel signal of a second color component at a high frame rate, and a frame rate correction section. The image capture sectionperforms non-destructive read of the pixel signal of the first color component in synchronization with the timing at which the pixel signal of the second color component is read during a charge accumulation time period defined by the first frame rate.

Image capture device with frame rate correction section and image generation method

In one embodiment, an image sensor includes, a bankof charge-coupled devices, and charge sensing amplifiers, each of which transforms electric charges extracted from an associated pixel into an electrical signal. After the electric charges accumulated in every pixel have been extracted to the charge-coupled devicesat the same time, a color component with a high resolution is output to a horizontal transfer pathvia the charge sensing amplifiersand then output to a device outside of the image sensor. Thereafter, pixel signals representing another low-resolution color component are vertically added together on the bankof charge-coupled devices. Those pixel signals are horizontally added together on the horizontal transfer pathand output. The image obtained by this image sensor is then input to an image processing section, thereby obtaining an output color image with a high resolution and a high frame rate.

Growing community of inventors

Osaka, Japan

Yusuke Okada