Shimadzu Corporation

Yusuke Koga

Takashi Ono

Sadamu Tomita

Satoshi Matsuoka

Hiromasa Maruno

Masahiro Ihara

Takumi Kobayashi

Eri Matsutani

One mode of an optical inspection apparatus according to the present invention is an optical inspection apparatus for optically inspecting an object, the optical inspection apparatus including: a biasing section () configured to apply, to a group of objects (A) on a stage, a force for moving the group of objects away with respect to the stage (); a catching section () including an adhesion portion () to which an object in the group of objects moved from the stage adheres; and an analysis section () configured to optically analyze the object caught by the catching section. This makes it possible to efficiently and satisfactorily perform optical analysis of individual microplastics by eliminating manual work of picking up the microplastics one by one.

Optical inspection apparatus and optical inspection method

An emitter for an X-ray tube device is configured to irradiate an anode with electrons for X-ray emission. The emitter includes an electron emission portion to be heated by an electric current, a current application leg for supplying the electric current to the electron emission portion, a support leg, a current application leg fixing portion for supporting the current application leg and supplying the electric current to the current application leg, and a support leg fixing portion for supporting the support leg. At least one of materials and shapes are different between the current application leg fixing portion and the support leg fixing portion so that a difference in an amount of thermal deformation between the current application leg and the support leg in a direction vertical to the electron emission portion is reduced when the electron emission portion is heated.

Emitter and X-ray tube device

An emitter that can be lighted even if a line of any part thereof is broken by ensuring an electric pathway. The X-ray tube device includes an electron emission surface P having an electric pathway; electric heating elementsthat are connected electrically to both ends of said electron emission surface; and two branched terminals that are branched in the middle of the electric pathway of the electron emission surface P between electric heating elementsand; second electric heating element, in order from the electric heating elementas the supporting elementand the supporting element; and further comprises: a relayA that switches the electric heating elementand the supporting elementto be in a short-circuit/open condition and a relayB switches the electric heating elementand the supporting elementto be in a short-circuit/open condition. A bypass electric pathway may be formed where the short-circuit condition is switched on and such bypass electric pathway can exist at all locations relative to the electric pathway between the electric heating elementsand

Emitter and X-ray tube device having the same

Growing community of inventors

Kyoto, Japan

Yusuke Koga