General Electric Company

Yury Alexeyevich Plotnikov

Ui Won Suh

Changting Wang

Harry Israel Ringermacher

Donald Robert Howard

William Stewart McKnight

Bryon Edward Knight

Jian Ying Li

Mark John Osterlitz

Jeffry Lynn Thompson

Gulperi Nuzhet Aksel

An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.

System and method for eddy current inspection of parts with complex geometries

A system for locating a failure event in a sample is disclosed. The system includes at least one sensor configured to detect acoustic energy corresponding to the failure event in the sample. The system also includes an infrared camera configured to detect a thermal release of energy corresponding to the failure event in the sample.

Systems and method for locating failure events in samples under load

Growing community of inventors

Niskayuna, NY, United States of America

Yury Alexeyevich Plotnikov