Other

Mts Systems Corporation

Yuriy Nikitich Pchelnikov

David Scott Nyce

An apparatus is disclosed for measuring a variable angular position of a movable part. The apparatus comprises at least two resonators formed by coupled slow-wave structures, and at least two movable targets having electrodynamic profiles, the targets also having a variable angular position. The angular position of the target is representative of the angular position of the movable part. An electromagnetic field is excited in the resonators at a frequency at which electromagnetic parameters of the resonators depend upon the position of the targets. A change in the angular position of the targets therefore causes a change in electrodynamic parameters of the resonators. The change in the electrodynamic parameters of the resonators is converted into a reading, such as an output voltage, which is indicative of the measured angular position.

Electromagnetic apparatus for measuring angular position

An apparatus is disclosed for measuring one or more parameters of a variable physical structure, at least one of the parameters being fluid level, position, velocity or acceleration. The apparatus includes an electromagnetic sensing element comprising at least two electrically conductive members that are electrically insulated from one another. A distributed capacitance and a distributed inductance are each formed along a length of the sensing element. The inductive reactance is at least ten percent of the capacitive reactance, thereby allowing the capacitance to be distributed, rather than acting as a 'lump capacitance'. The distributed capacitance enables shaping of the electric and magnetic fields around the electromagnetic sensing element so that disturbance by nearby electromagnetic fields, conductors, and dielectrics is minimized. When the apparatus is configured as a fluid level sensor, the capacitance is affected by the permittivity and the level of the measured fluid. A reference sensor can be used to compensate for changes in the permittivity of the fluid. When the apparatus is configured as a position sensor, the capacitance and/or inductance are affected by the position of an electrically conductive or dielectric target. The position measurement can be differentiated to obtain measurements of velocity or acceleration. Electronic circuits for operating the sensing element are also shown.

Distributed impedance sensor

A method and apparatus are disclosed for monitoring a linear position, such as the distance between a sensing element and a movable object, and/or related parameters, such as displacement, direction, speed, velocity, and/or acceleration. The method utilizes a sensing element and an electrically conductive portion of the movable object, or a conductive target coupled to the movable object. The apparatus includes at least one sensing element formed by a section of a coupled slow-wave structure. The sensing element is connected to an RF or microwave generator, and an electronic circuit that converts at least one electromagnetic parameter of the section of the coupled slow-wave structure into a position reading. Electric and magnetic fields excited in the sensing element are split so that most of the electric energy is concentrated inside of the sensing element, while most of the magnetic energy is concentrated outside of the sensing element. The distance that defines the linear position is measured as a resonant frequency, impedance, phase shift or other electromagnetic parameter.

Electromagnetic method and apparatus for the measurement of linear position

A device for measuring thin films and bulks is disclosed using slow-wave structures in electrodynamic elements to allow a decrease in frequency, an increase in sensitivity to electromagnetic parameters and accuracy of their monitoring. A method is also disclosed for monitoring of materials which includes placing an electrodynamic element near a monitored material and exciting an alternating electromagnetic field at an appropriate frequency to penetrate the monitored material concentrating in a small volume. Electromagnetic field parameters are then measured which are caused by the material parameters variation and said variations are converted to electromagnetic field parameters, the element being excited by an electromagnetic field in the form of at least one slowed electromagnetic wave.

Electromagnetic method of and apparatus for electromagnetic parameters of material (thin films and bulks) monitoring

A method and apparatus for monitoring one or more parameters of a variable physical structure, such as liquid level, is disclosed. The method and apparatus includes an electrodynamic element placed in proximity to a monitored structure and exciting within said element an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field penetrates into the monitored structure and then variations of the electromagnetic field parameters are measured for the element caused by a variation in the structure. The exciting of the electrodynamic element is by an electromagnetic field in the form of at least one slowed electromagnetic wave having suitable energy distribution of the electric and magnetic fields for the measuring of the electromagnetic field parameters.

Electromagnetic method of liquid level monitoring

An improved delay line with an input and an output is disclosed wherein a signal passing through the delay line from the input to the output can be optimized regarding the delay line component size, delay time, and signal configuration. The design and use of more than one impedance conductor is taught. The impedance conductors are arranged in specific alignments with each other and with dielectric bases to result in reduced component size, increased delay time, and to adjust the signal configuration. Further optimization of these features is taught through the use of a shield cover in specific alignment to the impedance conductors and dielectric bases.

Electromagnetic delay line with improved impedance conductor configuration

A method and apparatus is disclosed for monitoring an angular displacement, such as angle position and the direction of displacement. The method and apparatus includes at least one resonator placed in proximity to a electrodynamic profile and exciting within said resonator an alternating electromagnetic field. The electromagnetic field should be at a frequency at which the electromagnetic field contacts the electrodynamic profile and then variations of the electromagnetic field parameters are measured for the resonator caused by rotating the electrodynamic profile. Excitation of the resonator is by an electromagnetic field in the form of at least one slowed electromagnetic wave having a suitable energy distribution of the electric and magnetic fields for measuring the electromagnetic field parameters.

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Cary, NC, United States of America

Yuriy Nikitich Pchelnikov