Renesas Technology Corp.

Yuri Ikeda

Hiroyuki Sasaki

Makoto Saen

Jun Matsushima

Tomoyoshi Ujii

Yoshikazu Aoto

The present invention is directed to facilitate debugging in a semiconductor integrated circuit device including a plurality of microprocessors. A semiconductor integrated circuit device includes: a plurality of processors; a plurality of debug interfaces enabling debugging of the corresponding processors; a plurality of common terminals shared by the plurality of debug interfaces; a selection circuit capable of selectively connecting the plurality of debug interfaces to the common terminals; and a controller capable of controlling selecting operation in the selection circuit in accordance with a predetermined instruction. A first selector capable of selectively connecting the plurality of debug interfaces to a TRST terminal in the terminal group conformed with the JTAG specifications, and a second selector capable of selectively connecting the plurality of debug interfaces to terminals other than the TRST terminal are provided. With the configuration, even in the case where the number of processors increases, the invention can flexibly address the increase.

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Tokyo, Japan

Yuri Ikeda