Analog Devices Global

Analog Devices Global Unlimited Company

Analog Devices International Unlimited Company

Other

Analog Devices,inc.

Yunzhi Dong

Hajime Shibata

Jialin Zhao

Wenhua William Yang

Richard E Schreier

Trevor Clifford Caldwell

Zhao Li

David Nelson Alldred

Jose Barreiro Silva

Victor Kozlov

Gil Engel

Sharvil Pradeep Patil

Prawal Man Shrestha

Qingdong Meng

Lawrence A Singer

Gabriele Manganaro

Kimo Tam

Frank M Murden

Donald W Paterson

Martin McCormick

Kenneth William Martin

Martin Steven McCORMICK

Digital to analog converter generates an analog output corresponding to a digital input by controlling DAC cells using bits of the digital input. The DAC cells individually make a contribution to the analog output. Due to process, voltage, and temperature variations, the DAC cells may have duty cycle error or mismatches. To compensate for the duty cycle error of a DAC cell, a small amount of charge is injected into a low-impedance node of a DAC cell when the data signal driving the DAC cell transitions, or changes state. The small amount of charge is generated using a capacitive T-network, and the polarity of the charge injected is opposite of the error charge caused by duty cycle error. The opposite amount of charge thus compensates or cancels out the duty cycle error, and duty cycle error present at the output of the DAC cell is reduced.

DAC duty cycle error correction

Digital to analog conversion generates an analog output corresponding to a digital input by controlling unit elements or cells using data bits of the digital input. The unit elements or cells individually make a contribution to the analog output. Due to process, voltage, and temperature variations, the unit elements or cells may have mismatches and/or errors. The mismatches and/or errors can degrade the quality of the analog output. To extract the mismatches and/or errors, a transparent dither can be used. The mismatches and/or errors can be extracted by observing the analog output, and performing a cross-correlation of the observed output with a switching bit stream of the dither. Once extracted, the unit elements or cells can be adjusted accordingly to reduce the respective mismatches and/or errors.

Background duty cycle error measurement for RF DAC

Residue generation systems for use in continuous-time and hybrid ADCs are described. An exemplary system includes a filter, e.g. a FIR filter, for generating a filtered analog output based on an analog input, a quantizer for generating a digital input to a feedforward DAC based on the filtered analog output generated by the filter, a feedforward DAC for generating a feedforward path analog output based on the digital input generated by the quantizer, and a subtractor for generating a residue signal based on the feedforward path analog output. Providing a filter that filters the analog input before it is quantized advantageously allows blockers to be attenuated before they are sampled and aliased by the quantizer. At least some of the residue generation systems described herein may be implemented with relatively small design and power dissipation overheads.

Blocker tolerance in continuous-time residue generating analog-to-digital converters

A residue generation apparatus for use in continuous-time and hybrid ADCs is proposed. The apparatus includes a quantizer for digitizing an analog input to generate a digital output, and means for applying a first transfer function to the digital output from the quantizer to generate a digital input to a feedforward DAC, based on which the DAC can generate a feedforward path analog output. The apparatus further includes means for applying a second, continuous-time, transfer function to the analog input provided to the quantizer to generate a forward path analog output, and a subtractor for generating a residue signal based on a difference between the forward path analog output and the feedforward path analog output. Proposed apparatus allows selecting a combination of the first and second transfer functions so that, when each is applied in its respective path, the residue signal passed to further stages of an ADC is reduced.

Reducing residue signals in analog-to-digital converters

A linear continuous-time (CT) delaying summation block is one of the key building blocks for CT multi-stage analog-to-digital converters (ADCs) such as CT pipeline ADCs and CT multi-stage delta-sigma (MASH) ADCs. The CT summation block is typically used on a stage of a CT multi-stage ADC to subtract a digital-to-analog converter (DAC) output signal from an analog input signal of the stage. Rather than using a current-mode summation, the CT delaying summation block can be implemented with voltage-mode summation.

Oversampled continuous-time pipeline ADC with voltage-mode summation

An analog-to-digital converter (ADC) is a device that can include a reference shuffler and a loop filter. An ADC can achieve better performance with incremental adjustment of a pointer of the reference shuffler, changing coefficients of the loop filter, and storing calibration codes of the ADC in a non-volatile memory. By incrementally adjusting a pointer of the reference shuffler, a calibration can be performed more efficiently than with a random adjustment of the pointer. By temporarily changing the loop filter coefficients, a greater amount of activity can be introduced into the loop filter. This activity can allow the calibration to proceed more efficiently. By storing the calibration codes in a non-volatile memory, a search space for calibration codes can be reduced. Thus, a calibration can occur more quickly, and the calibration itself can be improved.

Flash analog-to-digital converter calibration

Analog-to-digital converters (ADCs) can be used inside ADC architectures, such as delta-sigma ADCs. The error in such internal ADCs can degrade performance. To calibrate the errors in an internal ADC, comparator offsets of the internal ADC can be estimated by computing a mean of each comparator of the internal ADC. Relative differences in the computed means serves as estimates for comparator offsets. If signal paths in the internal ADC are shuffled, the estimation of comparator offsets can be performed in the background without interrupting normal operation. Shuffling of signal paths may introduce systematic measurement errors, which can be measured and reversed to improve the estimation of comparator offsets.

Background flash offset calibration in continuous-time delta-sigma ADCS

For continuous-time multi-stage noise shaping analog to digital converters (CT MASH ADCs), quantization noise cancellation often requires estimation of transfer functions, e.g., a noise transfer function of the front end modulator. To estimate the noise transfer function, a dither signal can be injected in the front end modulator. However, it is not trivial how the dither signal can be injected, since the dither signal can potentially leak to the back end modulator and cause overall noise degradation. To address some of these issues, the dither signal is injected post the flash analog to digital converter (ADC) of the front end modulator. Furthermore, dummy comparator structures can be used to synchronize the dither with the quantization noise of the targeted flash ADC.

Dither injection for continuous-time MASH ADCS

For continuous-time multi-stage noise shaping analog-to-digital converters (CT MASH ADCs), quantization noise cancellation often requires accurate estimation of transfer functions, e.g., a noise transfer function of the front end modulator and a signal transfer function of the back end modulator. To provide quantization noise cancellation, digital quantization noise cancellation filters adaptively tracks transfer function variations due to integrator gain errors, flash-to-DAC timing errors, as well as the inter-stage gain and timing errors. Tracking the transfer functions is performed through the direct cross-correlation between the injected maximum length linear feedback shift registers (LFSR) sequence and modulator outputs and then corrects these non-ideal effects by accurately modeling the transfer functions with programmable finite impulse response (PFIR) filters.

Adaptive digital quantization noise cancellation filters for mash ADCs

An integrated constant time delay circuit utilized in continuous-time (CT) analog-to-digital converters (ADCs) can be implemented with an RC lattice structure to provide, e.g., a passive all-pass lattice filter. Additional poles created by decoupling capacitors can be used to provide a low-pass filtering effect in some embodiments. A Resistor-Capacitor 'RC' lattice structure can be an alternative to a constant-resistance Inductor-Capacitor 'LC' lattice implementation. ADC architectures benefit from the RC implementation, due to its ease of impedance scaling and smaller area.

RC lattice delay

For analog-to-digital converters (ADCs) which utilize a feedback digital-to-analog converter (DAC) for conversion, the final analog output can be affected or distorted by errors of the feedback DAC. A digital measurement technique can be implemented to determine timing mismatch error for the feedback DAC in a continuous-time delta-sigma modulator (CTDSM) or in a continuous-time pipeline modulator. The methodology utilizes cross-correlation of each DAC unit elements (UEs) output to the entire modulator output to measure its timing mismatch error respectively. Specifically, the timing mismatch error is estimated using a ratio based on a peak value and a value for the next tap in the cross-correlation function. The obtained errors can be stored in a look-up table and fully corrected in digital domain or analog domain.

Digital measurement of DAC timing mismatch error

This disclosure describes techniques and methodologies of using passive continuous time (CT) delay line for high-speed CT analog-to-digital converter (ADC) applications. In a continuous-time residual producing stage common to these CT ADCs, a proper delay between the analog input and DAC output is crucial. Specifically, using an inductor-capacitor (LC) lattice based delay element to enable high-performance CT pipeline ADC and CT delta-sigma (&#x394;&#x3a3;) ADC. The use of an LC lattice based delay element provides wide-band group delay for continuous-time signals with well-controlled impedance. This will be an essential circuit component to build a high-performance CT ADCs especially in architectures where the generation of a low-noise and low-distortion residual between the CT signal and its digitized version is needed. LC lattice based delay element enables noise-free, distortion-free wideband delay that is required for high speed continuous-time pipeline ADC and delta-sigma ADC.

LC lattice delay line for high-speed ADC applications

An optical receiver including a photo detector for converting a light signal into an electrical current signal and a preamplifier circuit for receiving the electrical current signal and outputting a corresponding voltage signal. In one example, the preamplifier circuit includes a first transistor having: (i) a high impedance node connected to an input node connected to receive the electrical current signal from the photo detector, and (ii) a control terminal connected to receive active negative feedback proportional to the electrical current signal received at the input node.

Optical receiver

Digital-to-analog converters (DACs) are used widely in electronics. The DACs are usually not ideal and typically exhibits errors, e.g., static mismatch errors. This disclosure describes a digital calibration technique for DAC static mismatch in continuous-time delta-sigma modulators (CTDSMs). The methodology utilizes the DAC unit elements (UEs) themselves to measure each other's mismatch. There are no extra circuitries except for the logic design inside DAC drivers or comparators. The methodology is an attractive calibration technique for high performance CTDSMs, especially for high speed system in multi-gigahertz range with low over-sampling rate (OSR).

Estimation of digital-to-analog converter static mismatch errors

The present disclosure describes an improved multi-stage noise shaping (MASH) analog-to-digital converter (ADC) for converting an analog input signal to a digital output signal. In particular, a full delta-sigma (&#x394;&#x3a3;) modulator is provided at the front-end of the MASH ADC, and another full &#x394;&#x3a3; modulator is provided at the back-end of the MASH ADC. The front-end &#x394;&#x3a3; modulator digitizes an analog input signal, and the back-end &#x394;&#x3a3; modulator digitizes an error between the output of the front-end &#x394;&#x3a3; modulator and the (original) analog input signal. In this configuration where the back-end modulator digitizes the error of the (full) front-end modulator, some design constraints of the front-end are relaxed. These design constraints include thermal noise, digital noise cancellation filter complexity (the quantization noise of the front-end is already shaped by the noise transfer function of the front-end), and/or non-linearity.

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Weehawken, NJ, United States of America

Yunzhi Dong