Canon Virginia, Inc.

Canon Kabushiki Kaisha

Yunzhe Zhao

Bradley Scott Denney

Nobuyuki Iwauchi

Nigel Patrick Brady

Devices, systems, and methods obtain an image; perform at least one nonlinear locally-adaptive mapping on the image, thereby generating a revised image; generate an edge-enhanced image based on the revised image; and perform dynamic contrast stretching on the edge-enhanced image, thereby generating an enhanced image.

Devices, systems, and methods for enhancing images

Some embodiments of devices, systems, and methods generate a respective connection mask at each defect detection location in a binary defect map, wherein each detection location in the binary defect map has a value that indicates that the detection location either has a defect or, alternatively, does not have a defect; generate one or more clusters of defect detection locations in the binary defect map based on each defect location's respective connection mask and on the binary defect map; generate respective bounding boxes for the one or more clusters; and recursively perform the following: checking respective sizes of the bounding boxes, and splitting any clusters of the one or more clusters that have respective bounding boxes with sizes that exceed one or more thresholds, thereby generating additional clusters of defect locations.

Devices, systems, and methods for limited-size divisive clustering

Some embodiments of systems, devices, and methods obtain a plurality of training images; obtain one or more target regions; generate one or more respective statistical characterizations of the one or more target regions; obtain a test image; locate the one or more target regions on the test image; compare the one or more target regions in the test image to the one or more respective statistical characterizations of the one or more target regions; and detect anomalies in the one or more target regions in the test image based at least in part on the comparison of the one or more target regions in the test image to the one or more respective statistical characterizations of the one or more target regions.

Metrology-based assisted defect recognition

A communication apparatus automatically establishes a wireless communication connection with an image processing apparatus. The communication apparatus captures one of more images of the image processing apparatus and determines, via image recognition process the identification information associated with the image processing apparatus. The communication apparatus automatically searches configuration information matching the identification information of the image processing apparatus and initiates the communication connection request. Communication apparatus provides the status information on a display screen of the communication apparatus and establishes a connection between the image processing apparatus and the communication apparatus.

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Irvine, CA, United States of America

Yunzhe Zhao