Princeton Technology Corporation

Yung-Yu Wu

Huei-Huang Chen

Yang-Han Lee

Cheng-Yung Teng

Hung-Wei Chen

Wei-Fen Chiang

Li-Jieu Hsu

In a controlling circuit, a photo coupler is used for isolating noises, and a general purpose amplifier is used for adjusting a gain, so that a logic tester may test analog signals in cooperation with relays having different specifications and operating voltage level differences in an analog measurement module. A shift register of each controlling circuit of a controlling module also transmits a test data signal to a next stage controlling circuit, so that a logic tester may simultaneously output a plurality of bits to multiple controlling circuits and multiple analog measurement modules by using merely one I/O port.

Controlling circuit for analog measurement module and controlling module thereof

In an adjustable voltage examining module, while a logic tester issues an input signal to an audio module under test, upper/low-threshold reference signals are simultaneously issued to an adjustable voltage comparing circuit. While the adjustable voltage comparing circuit receives a signal under test returned by the to-be-examined audio module after a while, the adjustable voltage comparing circuit loads both an high-threshold reference voltage and a low-threshold reference voltage respectively indicated by the reference upper/low-threshold signal so as to compare both the upper and low-threshold reference voltages with the signal under test. Therefore, while the signal under test is examined to acquire a voltage level between voltage levels of the upper and low-threshold reference signals, precise operations of the audio module under test are assured, and time wasted by continuously-issued interrupt is saved.

Adjustable voltage comparing circuit and adjustable voltage examining device

The invention discloses a circuit testing apparatus for testing a device under testing. The circuit testing apparatus includes a logic tester and a signal-measuring module. The logic tester is coupled to the device under testing for providing a testing signal and a trigger signal, and then determining a testing result for the device under testing according to a digital measuring result. The signal-measuring module coupled to the device under testing and the logic tester, is utilized for measuring a DC signal generated by the device under testing according to the testing signal after receiving the trigger signal, and generating the digital measuring result.

Circuit testing apparatus

The invention provides a logic tester. In one embodiment, the logic tester is coupled to a plurality of tested devices, and includes a function generator and a pattern comparator. The function generator generates an initial code sequence as an input signal of the tested devices to fix output signals of the tested devices to a first value, and then generates a functional code sequence as the input signal of the tested devices to trigger the output signals of the tested devices to change from the first value to a second value. The pattern comparator converts the output signals of the tested devices to a plurality of bitstreams after the functional code sequence is generated, calculates numbers of bits corresponding to the first value in the bitstreams, estimates delay periods of the tested devices according to the numbers of bits, and outputs the delay periods of the tested devices.

Logic tester and method for simultaneously measuring delay periods of multiple tested devices

A testing apparatus includes a public test board, a single DUT (device under test) test board and a holder. The public test board includes a plurality of public test channel sets each having a plurality of public signal terminals for receiving test signals. On the single DUT test board, a plurality first signal terminals are arranged according to the pin layout of a DUT, a plurality second signal terminals are arranged according to the terminal layout of a public channel set, and a plurality traces are arranged for electrically connecting corresponding first and second signal terminals. The holder can connect the pins of the DUT to corresponding first signal terminals.

Testing apparatus with high efficiency and high accuracy

The invention discloses a testing circuit board for placing a device under test and further testing the device under test according to a plurality of testing signals generated by a tester. The testing circuit board includes a circuit board and a plurality of sets of sockets. The circuit board includes a plurality of connecting holes. The plurality of sets of sockets are located on a plurality of connecting holes and electrically connects to the device under test via a plurality of connecting interfaces for transferring the plurality of testing signals to test the device under test.

Growing community of inventors

Yilan County, Taiwan

Yung-Yu Wu