Other

United Microelectronics Corp.

Siliconware Precision Industries Co., Ltd.

Fujian Jinhua Integrated Circuit Co., Ltd.

Yung-Ming Wang

Shu-Yen Chan

Tien-Chen Chan

Ger-Pin Lin

Cheng-Shao Chen

Wen-Chin Liang

Chih-Ming Yang

Chung-Shien Wang

Chao-Ming Tu

A control method is provided and used to place a target object on a test platform in a cabin of a testing device, to sense the temperature of the target object by a temperature response structure, and then to receive temperature signals of the temperature response structure by a controller, where the controller can regulate the pressure inside the cabin to control the air pressure of the cabin, so that the target object can still maintain good heat dissipation under high power consumption.

Testing device for burn-in test operations and control method thereof

A fan module and a hat with a fan module are disclosed. The fan module includes a case, a fan, and an air guide tube. The case includes a connecting portion, wherein the case is detachably engaged with a visor of a hat. The case has a receiving space and an air outlet, wherein the air outlet communicates with the receiving space. The fan is rotatably provided in the receiving space of the case. An airflow is generated when the fan rotates, wherein the airflow is exhausted out of the case through the air outlet. The air guide tube is connected to the case, and guides the airflow to a space between the head of a wearer and the main body. Whereby, the hat with the fan module could provide not only sunscreen protection, but also a cooling effect.

Fan module and hat with fan module

A method for fabricating semiconductor device includes the steps of: providing a substrate having a memory region defined thereon; forming a trench in the substrate; performing a first ion implantation process to form a first doped region having a first conductive type in the substrate adjacent to the trench; forming a gate electrode in the trench; and performing a second ion implantation process to form a second doped region having a second conductive type in the substrate above the gate electrode.

Method for fabricating semiconductor device

Growing community of inventors

Taichung, Taiwan

Yung-Ming Wang