Industrial Technology Research Institute

Yung-Lin Chen

Chir-Weei Chang

Chia-Chen Chen

Kuo-Tung Tiao

Chy-Lin Wang

Wei-Jia Huang

Hsien-Chang Lin

Hsin-Yueh Sung

Chuan-Chung Chang

An extended depth of field microscope system for phase object detection includes an imaging optical module and a phase/intensity converting module. The imaging optical module has an object lens group, in which an axial symmetric phase coding is added, to produce an axial symmetric spherical aberration. A point spread function (PSF) and an image with extended depth of field can be obtained with a predetermined level of similarity. The phase/intensity converting module converts the phase change of the light passing the phase object, into an image light with change of light intensity.

Extended depth of field microscope system

A ranging apparatus including an image sensor, an imaging lens, and a processor is provided. The imaging lens is configured to image an object on the image sensor to produce an image signal having at least one image parameter, wherein the at least one image parameter changes with a change of an object distance of the object. The processor is configured to determine the change of the object distance according to a change of the at least one image parameter. A ranging method and an interactive display system are also provided.

Ranging apparatus, ranging method, and interactive display system

Growing community of inventors

Yunlin County, Taiwan

Yung-Lin Chen