Kabushiki Kaisha Toshiba

Yun Xiang

Satoshi Ito

According to one embodiment, an anomaly detection device includes a processor that is configured to acquire input data. The processor derives a first anomaly degree corresponding to a difference between first feature data derived from the input data using a trained deep model and second feature data derived from the input data using a trained prediction model. The processor derives a second anomaly degree corresponding to an estimated relative positional relationship between a first and second region in the image data based on the second feature data. A total anomaly degree for the input data is then calculated from the first anomaly degree and the second anomaly degree.

Growing community of inventors

Tokyo, Japan

Yun Xiang