Industrial Technology Research Institute

Yun-Hui Chang

Shih-Che Lo

Shih-Chou Chen

Ching-Tang Yang

Din-Ping Tsai

Chi-Wen Yang

Yuan-Ying Lu

A knock mode scanning near-field optical microscope comprises a light source member, an optical fiber probe connected at one end thereof with the light source member such that other end of the optical fiber probe forms a near-field point source of light, and that the optical fiber probe is attached with one end of a suspension arm member of an oscillation member. The oscillation member further has a piezoelectric ceramics, which is disposed on the suspension arm member, and is driven by a harmonic wave signal by a signal feedback member so as to bring about a change in amplitude and phase of the optical fiber probe in order to result in a feedback control.

Knock mode scanning near-field optical microscope

A method for making a probe device makes use of the main shaft of an electrodischarge machining machine to mount thereon a probe for effecting the drilling operation of a PCB board. Upon completion of the drilling operation, the probe is severed and then fastened with the PCB board.

Method for making a probe device having detective function

Growing community of inventors

Taipei Hsien, Taiwan

Yun-Hui Chang