Samsung Electronics Co., Ltd.

Yun-hong Kim

Hee-Sung Chae

Dah-som Kim

Hyeok-jong Lee

An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.

Image sensor with test circuit

An image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter having a first counter for converting an analog signal into a digital signal, and an output buffer having a first memory. A first counter test result value generated as a test result for the first counter is stored in the first memory in a test mode. The output buffer outputs the first counter test result value from the first memory to an outside of the output buffer in response to a first selection signal. The output buffer further includes a reset logic circuit for resetting the first memory depending on whether the first counter test result value is output or not. The plurality of pixels generate the analog signal in response to incident light.

Growing community of inventors

Hwaseong-si, South Korea

Yun-hong Kim