Hitachi, Ltd.

Other

Hitachi Maxell, Limited

Hitachi-lg Data Storage, Inc.

Hitachi Koki Co., Ltd.

Hitachi High-tech Corporation

Maxell, Ltd.

Hitachi Maxwell, Ltd.

Nippon Columbia Co., Ltd.

Yumiko Anzai

Akemi Hirotsune

Motoyasu Terao

Makoto Miyamoto

Tetsuya Nishida

Junko Ushiyama

Keikichi Andoo

Hiroyuki Minemura

Tsuyoshi Toda

Hideki Saga

Masatoshi Ohtake

Toshimichi Shintani

Harukazu Miyamoto

Yasushi Miyauchi

Yoshinori Miyamura

Soichiro Eto

Keikichi Ando

Koji Hirata

Takahiro Kurokawa

Mitsuhide Miyamoto

Norio Ohta

Nobuyuki Kimura

Hidehiro Ikeda

Naoyuki Kofuji

Masahiko Takahashi

Toshio Niihara

Kentaro Osawa

Jiro Yamamoto

Reiji Tamura

Hiromi Kudo

Yoshihiro Ikari

Tamotsu Fuchioka

Hitoshi Watanabe

Akira Arimoto

Yoshio Suzuki

Yoichi Ose

Kenchi Ito

Takashi Ohshima

Yoshitaka Sasago

Yoshito Tsunoda

Shigeo Moriyama

Fumiyoshi Kirino

Takeshi Hoshino

Toshihide Agemura

Momoyo Enyama

Shinkichi Horigome

Hiroshi Shiraishi

Hideharu Mikami

Takahiro Morikawa

Youichi Horii

Fumihiko Uchida

Takashi Nishimura

Hiroko Sukeda

Masaki Mukoh

Rieko Otsuka

Keizo Kato

Yoshiko Nishi

Kazuhiko Nakano

Yoshimasa Kondo

Mokoto Miyamoto

Hisae Wakabayashi

Hisae Sasaki

To improve brightness of an image to be perceived by a user and enhance visibility there is provided a light guide plate including an incident diffraction grating which diffracts incident imaging light, an exit diffraction grating through which the imaging light goes out, and an intermediate diffraction grating existing in optical paths from the incident diffraction grating to the exit diffraction grating. In this light guide plate, a periodic linear corrugated pattern is formed as the incident diffraction grating, and when an imaginary line is established that passes through an incident point of imaging light onto the incident diffraction grating and is parallel with a periodic direction of the corrugated pattern, the intermediate diffraction grating has a first region on one side of the imaginary line and a second region on another side of the imaginary line.

Light guide plate and image display device

To provide an electron microscope capable of performing the switching-over between normal illumination and annular illumination, wide-area irradiation, an interference pattern as desired or normal illumination in an expeditious and readily manner or achieving a better S/N ratio, the electron microscope comprises a photocathodewith negative electron affinity in use; an excitation optical system to excite the photocathode; and an electron optics system to irradiate an electron beamgenerated from the photocathode by excitation lightirradiated through the excitation optical system onto a sample, the excitation optical system including a light source devicefor the excitation light; and an optical modulation meanswhich is disposed in an optical path of the excitation light to perform spatial phase modulation to the excitation light.

Electron microscope

In order to improve a characteristic of an optical element, an optical element (polarizing filter) including a substrateS having a wire-grid regionA and a peripheral regionA positioned on an outer periphery thereof is made to have the following configuration. A wire-grid in which a plurality of line-shaped wires Pmade of Al and extending in a y direction are arranged at spaces S in an x direction is provided in the wire-grid regionA of the substrateS, and a pattern (repetitive pattern) in which a plurality of protruding portions Pmade of Al are arranged is provided in the peripheral regionA. This pattern is, for example, a checkerboard pattern. According to the above-mentioned configuration, the plurality of wires Pcan be arranged so that their respective ends are spaced apart from an end of the substrateS, so that the wires Pcan be prevented from being deformed and nicked. Also, by the plurality of protruding portions Pin the peripheral regionA, it is possible to prevent water from entering the wire-grid regionA.

Optical element, manufacturing method of optical element, and optical device

An objective of the present invention is to provide a technique for reducing measurement errors when measuring specimen using light. An aspect of an optical measurement method according to the present invention: acquires relationship data that describes a relationship between an intensity of reflection light when irradiating light onto a specimen and a size of the specimen; and acquires the size of the specimen using the relationship data and the intensity of the reflection light. Another aspect of an optical measurement method according to the present invention subtracts a component due to an inclination of a vessel of a specimen from a detection signal representing an intensity of reflection light when irradiating light onto the specimen, thereby correcting the inclination of the vessel.

Optical measurement method and appartus

Provided are an optical element and an optical device using the optical element to which a manufacturing process for manufacturing a wire-grid structure can be basically applied, and besides, in which a higher polarization contrast ratio than that of a wire-grid element can be obtained. A wobbled wire element in an embodiment has a feature that a periodic structure having a period equal to or larger than a wavelength of an incident light wave is formed in a y direction. In this manner, in a wobbled wire element in a first embodiment, a polarization contrast ratio can be significantly improved.

Optical element and optical device

Provided is an optical measuring device that can realize a wide measurement region without an increase in the measurement time or a reduction in the measurement region while avoiding damage to a measurement target due to excessive light exposure, using a simple configuration. The device includes a light source, an optical splitting unit configured to split a light beam emitted from the light source into a signal beam and a reference beam, an objective lens configured to focus the signal beam and irradiate a measurement target with the signal beam, a scanning unit configured to move the focus position of the signal beam, an optical element having lower transmissivity in its peripheral portion than in its central portion, interference optics configured to combine the reference beam with the signal beam reflected or scattered by the measurement target, thereby generating interference beams, and photodetectors configured to detect the respective interference beams.

Optical measuring device

A technology that allows improvement in the performance of an optical element a representative example of which is a polarizing element is provided. In a split wire element according to an embodiment of the invention, each of a plurality of split wires (SPW) has gaps formed in a y direction at a period &#x39b;, and the period &#x39b; is greater than or equal to a Rayleigh wavelength (&#x3bb;/n). According to the thus configured split wire element of the embodiment of the invention, optical performance can be improved as compared with a wire-grid element formed of straight wires having no periodic structure in the y direction.

Optical element and optical apparatus

The present invention provides a small and inexpensive optical element that integrates a reflecting mirror and a wave plate function. A reflecting wave plate is configured by arranging a periodic metal comb-like structure whose pitch is equal to or below a wavelength and a mirror structure with a distance equal to or below a coherence length.

For decreasing a recording current and suppressing a cross erase simultaneously, a three-dimensional phase-change memory for attaining higher sensitivity and higher reliability by the provision of a chalcogenide type interface layer is provided, in which an electric resistivity, a thermal conductivity, and a melting point of the material of the interface layer are selected appropriately, thereby improving the current concentration to the phase-change material and thermal and material insulation property with Si channel upon writing.

Semiconductor memory device

An intermediate layer including at least one of elements constituting a phase change material and silicon is arranged between a recording layer composed of the phase change material and an npolysilicon film to reduce contact resistance between the recording layer and the npolysilicon film, thereby simplifying the structure of a phase change memory and reducing the cost thereof. If the phase change material contains Ge, Sb, and Te, for example, the intermediate layer includes at least one of Si&#x2014;Sb, Si&#x2014;Te, and Si&#x2014;Ge.

Semiconductor storage device

In forming a space layer of a multi-formation-layer recording medium, there are provided a medium having a high precision in a thickness of the space layer and its manufacturing process. In the multi-formation-layer recording medium wherein at least two pairs of an information recording layer and a translucency spacer are layered on a substrate having physical patterns composed of an optical spot groove and/or pits on the surface, an average thickness of the translucency spacers in an information zone is 15 &#x3bc;m or less, and a difference in spacer thickness between a minimum value and a maximum value is 2 &#x3bc;m or less.

Multi-information-layer recording medium and manufacturing process

An optical disc using super-resolution effects that achieves higher-density recording exceeding the optical resolution suffers from the signal-quality degradation caused by the normal resolution component included in the reproduction signal. To address this problem, a data reproduction method is provided. In the method, characteristic error patterns are identified and parity check codes in conformity with run-length limited coding are used to carry out efficient and reliable error correction. Error patterns caused by the normal resolution crosstalk are localized in the leading edges of a mark following a long space and in the trailing edges of a long mark. Whether an error exists in the data is determined by use of the parity check codes. When an error occurs, a pattern in which an error is most likely to occur is selected from the above-mentioned patterns by taking account of the edge shift direction, and then the error therein is corrected.

Digital information reproduction method

A super-resolution material is formed in only a data pit, in a low temperature state of the super-resolution material, reflectivity of each of a pit portion and a space portion and an optical phase difference therebetween are set to be sufficiently small, in a high temperature state, and at least the optical phase difference between the pit and the space is set to be larger than the aforementioned value in an absolute value. Accordingly, by conducting irradiation with an appropriate read power by which substantially only one data track width can be heated to a high temperature state, a good push-pull signal can be obtained even with a track pitch being less than a diffraction limit. At the same time, by an optical device having functions such as a switching means with a DPP type, an offset correcting means of the push-pull signal due to lens shift, a shaping means of the push-pull signal, a learning means of read power, and the like, there is provided an optical disk device that corresponds to the optical disk medium of the present invention and achieves an increase in capacity.

Optical disk medium and tracking method

Recording information is disclosed in which an information recording medium is irradiated with a recording energy beam that is power-modulated into at least a record power level and a record-ready power level lower than the record power level. The information is recorded on the recording medium in the form of length and interval of a mark portion. When forming a mark portion of a predetermined length, the radiation energy of the energy beam is increased as compared with when forming a mark portion of a different length before or after the first pulse of an energy beam pulse train including at least a pulse for forming the mark portion.

Information recording method and apparatus with suppressed mark edge jitters

Growing community of inventors

Ome, Japan

Yumiko Anzai