Canon Kabushiki Kaisha

Yuma Kitagawa

Norihiko Nishizawa

Kazuyoshi Itoh

Kiichi Fukui

Yasuyuki Ozeki

Shinichiro Kajiyama

Fumihiro Dake

Kazuhiko Sumimura

An optical microscope that can prevent an increase in the complexity of the light source system is equipped with optics readily capable of adequate operation even when the modulation frequency is increased to reduce the impact of the intensity noise of the laser. The optical microscope irradiates a sample with a first train of optical pulses having a first optical frequency, which is generated by a first light source, and a second train of optical pulses having a second optical frequency, which is temporally synchronized with the first train of optical pulses and is generated by a second light source, and detects light scattered from the sample. A first repetition frequency of the first train of optical pulses is an integral sub-multiple of a second repetition frequency of the second train of optical pulses.

Optical microscope and optical instrumentation

The invention provides an optical microscope that prevents an increase in the complexity of the light source system and is equipped with optics readily capable of adequate operation even when the modulation frequency is increased in order to reduce the impact of the intensity noise of the laser, etc. This optical microscopeirradiates a samplewith a first train of optical pulses having a first optical frequency, which is generated by a first light source, and a second train of optical pulses having a second optical frequency, which is temporally synchronized with the first train of optical pulses and is generated by a second light source, and detects light scattered from the sample. The repetition frequency of the train of optical pulses generated by the first light source is an integral sub-multiple of the repetition frequency of the train of optical pulses generated by the second light source.

Growing community of inventors

Osaka, Japan

Yuma Kitagawa