Hitachi, Ltd.

Hitachi Engineering Services Co., Ltd.

Yukiya Hattori

Hiroshi Kitaguchi

Hiroshi Miyai

Shigeru Izumi

Yasuko Aoki

Katsutoshi Sato

Hiroya Koshishiba

Hidehiro Okada

Kyoichiro Wakayama

An image pickup unit is disposed so as to be able to obtain a scan projection image of an inspection subject from each of a vertical direction and a horizontal direction. An X-ray absorption coefficient of an object in the inspection subject is obtained from the vertical scan projection image and the horizontal scan projection image. It is determined whether there is a threat in the inspection subject on the basis of the X-ray absorption coefficient. Furthermore, a CT image is obtained by moving the image pickup unit around the inspection subject. It is determined whether there is a threat in the inspection subject, on the basis of the CT values of the CT image.

Apparatus and method for detecting threats

A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.

Non-destructive inspection apparatus and inspection system using it

Growing community of inventors

Hitachi, Japan

Yukiya Hattori