Olympus Corporation

Olympus Optical Company, Ltd.

Hamamatsu-photonics K.k.

Asahi Kogaku Kogyo K.k.

Yukio Eda

Terumasa Morita

Sadashi Adachi

Tetsuya Osajima

Tomio Endo

Norio Kurita

Nahoko Hisata

Katsuya Sadamori

Atsumi Kaneko

Toshiaki Matsuzawa

Yasuhiro Kamihara

Go Ryu

Masato Yabe

Daisuke Yokoi

Norio Maruyama

Hirohisa Fujimoto

Yukawa Hiroshi

A laser condensing optical system of the present invention includes a laser beam source which emits a laser beam, a condensing optical system which is arranged between the laser beam source and a medium and condenses the laser beam in the medium, and a laser divergence point moving unit which can move the position of a laser divergence point of the laser beam along an optical axis of the laser beam in accordance with the refractive index of the medium in which the laser beam is desired to be condensed and the distance from a surface of the medium to a position where the beam is desired to be condensed.

Laser processing device

A wavelength selection unit includes a light source which emits light of at least a predetermined wavelength region, a collector lens which collects the light emitted from the light source and emits a parallel flux which is inclined relative to a light axis of an optical system of itself, a selective reflection optical system which reflects light of a predetermined wavelength region from the parallel flux selectively, and a returning optical system which returns each reflected flux reflected by the selective reflection optical system symmetrically about a reflected light axis of the selective reflection optical system. The collector lens collects a back flux which is returned by the returning optical system and which is re-reflected by the selective reflection optical system, and forms a light source image of the light source.

Light source apparatus and microscope apparatus

This lens evaluation device comprises a plurality of point light sources arranged on the plane, an imaging unit for picking up an object and obtaining its image, a movement unit for changing the relative distance between the point light source or the imaging unit and the optical system to be evaluated, a storage medium for recording stack images obtained by the imaging unit picking up the images of the plurality of point light sources via the optical system every time the movement unit changes the relative distance, an image position calculation unit for calculating a plurality of image positions from the plurality of pieces of point light source image in the stack image recorded on the storage medium and an aberration acquisition unit for fitting an aberration model function to the plurality of image positions calculated and obtaining an aberration measurement value.

Lens evaluation device

A laser condensing optical system of the present invention includes a laser beam source which emits a laser beam, a condensing optical system arranged between the laser beam source and a medium, the condensing optical system condensing the laser beam in the medium and recondensing light from a condensing point, a photodetector which detects the light recondensed by the condensing optical system, and a laser divergence point moving unit which moves the position of a laser divergence point of the laser beam along an optical axis of the laser beam in accordance with the refractive index of the medium in which the laser beam is condensed and the distance from a surface of the medium to a condensing position.

Laser condensing optical system

In a confocal microscope, a beam of light from a light source is lead to a rotary disk by way of an optical lens and a half mirror, and made to strike specimen by way of an objective lens. The rotary disk has random pin hole pattern sections where pin holes are randomly bored through a light blocking mask, and an aperture section having an area k times greater than the area of the random pin hole pattern sections and allowing any light to pass therethrough. The beam of light reflected by the specimen is made to enter a CCD camera by way of the objective lens, the rotary disk, the half mirror and a condenser lens. The CCD camera is adapted to selectively pick up a composite image containing a confocal image component and a non-confocal image component of the specimen obtained through the random pin hole pattern sections and a conventional image of the specimen obtained through the aperture section. Then, a CPU carries out an arithmetic operation of subtracting the conventional image data from the composite image data by means of a difference program to produce a confocal image of the specimen.

Confocal microscope

A confocal microscope is provided which uses a confocal disk. The confocal microscope includes a light source, a high-NA and low-magnification objective lens which forms an image of the confocal disk obtained by irradiation with a light from the light source on a sample, and a first image formation lens system disposed between the confocal disk and the objective lens. A first image formation lens driving mechanism is provided for moving the first image formation lens system in a light axis direction and adjusting a focal point position of the objective lens with respect to the sample, and a second image formation lens system is provided which forms a sectioning image formed on the confocal disk into an image by photoelectric conversion.

Confocal microscope and height measurement method using the same

Wavelength stabilizing apparatus

A surveying instrument comprising optical system means having an optical axis to be coincided with an object to be observed, positional deviation detecting means for detecting the deviation of said optical axis with respect to the object and either means for displaying the detection result of said positional deviation detecting means or means for driving said optical system according to the detection results of said positional deviation detecting means so as to bring said axis in coincidence with the object. According to the present invention, an observer can achieve surveying operation over watching the display, and thus easy and accurate operation is possible.

Surveying instrument

Growing community of inventors

Tokyo, Japan

Yukio Eda