Asahi Glass Company, Limited

Yukiko Nagashima

Ken Uemura

Kazuaki Shimizu

Tetsuo Miyake

Yasunari Saito

Takao Kurita

A method of measuring a distortion of a transmitting beam, characterized in that a transmitting beam is emitted from a beam generator and projected onto a screen as a bright spot, the bright spot is scanned over a surface of the screen, and a distortion of the transmitting beam is measured on the basis of a distance between a first location of the bright spot on the screen at a first time when the transmitting beam is incident on a beam receiving device in a specified incident direction upon transmitting through a measured body, and a second location of the bright spot on the screen at a second time when the transmitting beam is incident on the beam receiving device in the specified incident direction upon not transmitting through the measured body. A surface shape of a three-dimensional object may also be measured on the basis of a distance between a first location of the bright spot on the screen at a first time when the transmitting beam is incident on a beam receiving device in a specified incident direction upon being reflected from a surface of a three-dimensional measured body, and a second location of the bright spot on the screen at a second time when the transmitting beam is incident on the beam receiving device in the specified incident direction upon being reflected from a surface of a reference body. The present invention provides measurements having improved accuracy for objects of any size irrespective of the resolution of the beam receiving device.

Growing community of inventors

Yokohama, Japan

Yukiko Nagashima