Mitutoyo Corporation

Mitutoyo Mfg. Co., Ltd.

Yukiji Yoda

Hideo Takaku

Matusiro Fujitani

Sadayuki Matsumiya

Yoshikazu Kobayashi

Kenji Okabe

Hideo Sakata

Tomoyuki Miyazaki

Masanori Arai

Shunsaku Tachibana

Yutaka Nishitsuji

Takao Kawabe

Keiji Akagi

A touch signal probe comprises a fixed member, a movable member, a bias means, a drive member, a deformation touch signal processing circuit, a contact touch signal processing circuit, and a latch circuit. A stylus is attached to the movable member. The drive member relatively drives reseat position elements respectively placed on the fixed member and the movable member. The bias means restores the movable member to a still position. The deformation touch signal processing circuit generates a deformation touch signal. The contact touch signal processing circuit uses the reseat position elements as make-and-break electric contacts to generate a contact touch signal. The latch circuit inputs coordinate values every instant at which the deformation touch signal is output and stores the coordinate values as the most recent coordinate values for update, and when the contact touch signal is output, outputs the most recent coordinate values as detected coordinate values.

Touch signal probe and signal processing apparatus and signal processing method of the same

In an optical gauge according to the invention, a mirror holder ring 21 is fitted to the outer periphery of the objective lens 12 and an light path bending mirror 22 is rotatably secured at the upper end thereof to the mirror holder ring 21. With such an arrangement, the light downwardly emitted from an optical system 3 irradiates the top plane of an object of measurement when the light path bending mirror 22 is held in parallel with the optical axis of the optical system 3. On the other hand, the light emitted from the optical system 3 is rectangularly turned to irradiate a lateral plane of the object of measurement when the light path bending mirror 22 is turned around its upper end to a position where it is inclined by 45.degree. relative to the optical axis of the optical system 3. Thus, an optical gauge according to the invention can observe one or more than one lateral sides of the object of measurement for dimensional measurement without modifying its attitude.

Optical gauge with adjustable light path bending mirror

A simple three-dimensional measuring machine 1 having a simple structure which enables the assembly thereof by the end users, and a packing case 100 for facilitating a transport of the machine 1. A pair of columns used when necessity arises and the X axis member 5 are assembled and disassembled and the X slider 6 and the Y slider 7 are also assembled and disassembled through a first means 20 for adjusting the angles therebetween. The Y axis member 8 and the Z slider 9 which has a Z axis member 11 are connected through a second means 30 for adjusting the angles therebetween. The packing case 100 for transfer has a first packing case to house the column 3 and the height adjustment pedestal 2, a second packing case to house the X axis member 5 and the X slider 6, a third packing case to house the Y axis member 8 with the Y slider 7 and the Z slider 9 with the Z axis member 11 connected through the second means 30 for adjusting the angle and a Y-Z axis cover 17, and an exterior packing case.

Simple three-dimensional measuring machine

A coordinate measuring instrument, wherein a measuring element support member (1) having a measuring element (2) is movably supported on a mount plate (3), this measuring element (2) is abutted against the surface and the like of a work to be measured, which is mounted on the mount plate (3), and relative movement values between this measuring element (2) and the work are detected to measure a configuration and the like of the work. In this measuring instrument, vertical surfaces (3A, 3B, 50A and 50B) are formed on the mount plate (3) and air bearings (47, 52 and 53) opposed to these vertical surfaces are provided on legs (8 and 9) of the measuring element support member (1), so that the measuring element support member (1) can be regulated in its position in a direction of X-axis.

Coordinate measuring instrument

This invention relates to measuring instruments such as a three-dimensional measuring instrument having a device for protecting the surface of a scale provided on a guide rail for moving a measuring element support member. A scale (7) secured to one side surface of one of guide rails provided at opposite side surfaces of a bedplate (1), on which a work (18) to be measured is rested, is covered by a pair of a constant load spring. These constant load springs (8) and (8) are solidly secured at the ends at one side to shock absorbers (20) and (20) provided at the end portions of the guide rail (4) and connected at the ends at the other side to a pair of retractors (27) and (27) provided in a support (10) of a measuring element support member (9), and the constant load springs (8) and (8) can be suitably extended or wound by following movements of the measuring element support member (9), so that adhesion of oil to the surface of the scale (7) and the like can be effectively prevented, thus enabling to secure the stable measuring accuracy.

Measuring instrument

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Kawasaki, Japan

Yukiji Yoda