Canon Kabushiki Kaisha

Yuki Oshima

Kenji Yamazoe

Yutaka Sato

Tomoo Akizuki

Toru Imaizumi

Masafumi Maeda

Takaaki Akamatsu

Shoichiro Ikegami

Osamu Sasaoka

Sho Taguchi

Tatsuya Kinukawa

An image forming apparatus includes a controller controlling conveyance of first and second recording materials. The controller calculates based on an acquired length of the second recording material in the conveyance direction before feeding, a loosening amount of the second recording material between a conveyance nip and a transfer nip when the second recording material is nipped therebetween. The controller determines based on the acquired information on the image, whether an image exists in a blurring region where an image defect is generated in the image to be transferred due to an impact that occurrs when a trailing end of the second recording material with respect to the conveyance direction passes through the conveyance nip. The controller extends a conveyance interval between the first and second recording materials when it is determined that the loosening amount is a predetermined value or more and the image exists in the blurring region.

Image forming apparatus

A fixing device includes first and second rotation members, a heater holder having a protrusion, and a heater having a heating element and a substrate having a longitudinal direction and a thickness direction. The protrusion is disposed at a position, which is outside a nip portion and on a downstream side in a conveyance direction of a recording material, and comes into contact with the first rotation member. The protrusion protrudes in the thickness direction toward the second rotation member without crossing a nip tangent line that passes through a contact surface between the first rotation member and the second rotation member and extends parallel to the contact surface, and a length in the longitudinal direction of the protrusion is shorter than a length in the longitudinal direction of the recording material of a maximum size which is able to be conveyed.

Fixing device and image forming apparatus

A heater includes: a substrate; an insulating layer that is provided on the substrate; and a heat generating element that is provided on the insulating layer, and in a case where a region including a center of the substrate is defined as a first region, a region on a side closer to one end portion than the first region is defined as a second region, and a region on a side closer to the other end portion than the first region is defined as a third region in a transverse direction that is orthogonal to a longitudinal direction of a surface of the substrate on which the insulating layer is provided, the first region is a plane, and the second region and the third region are bent from the first region in a thickness direction of the substrate that is orthogonal to the longitudinal direction and the transverse direction.

Heater, heating device, and image forming apparatus

The present invention provides a method of measuring a shape of a target surface, including a step of obtaining shape data by causing a stage which holds the target surface to rotate the target surface about a rotation axis, positioning each of a plurality of partial regions of the target surface in a field of view of a measurement apparatus, and causing the measurement apparatus to measure each of the plurality of partial regions, a step of obtaining, for each of a plurality of partial contour regions, a central position of the target surface using data of a contour included in the shape data, and a step of obtaining, based on the obtained plurality of central positions, a position of the rotation axis of the target surface in positioning each of the plurality of partial regions.

Measurement method, measurement apparatus, non-transitory computer-readable storage medium, and optical element fabrication method

A measurement method of the present invention is a measurement method which measures a target divided into a plurality of partial regions to measure a whole shape of the target by stitching the plurality of partial regions. The measurement method comprises Steps Sto Swhich measures a plurality of partial regions, Step Swhich determines an error in a partial region that is a reference, Step Swhich calculates each of errors in the plurality of partial regions, and Step Swhich performs a correction depending on each of the errors to stitch the plurality of partial regions. Steps Sto Sare repeatedly performed by changing the partial region that is the reference (S).

Measurement method and measurement apparatus

A measurement method of the present invention is a measurement method for measuring a shape of a target T from an interference pattern generated by interference between a reflected light of the target and a reference spherical surface. The measurement method includes a first measurement step which positions the target T in a first regionat a light source side with respect to a focal positionof the reference spherical surface to measure the interference pattern, and a second measurement step which positions the target T in a second regionopposite to the first region with respect to the focal positionof the reference spherical surface to measure the interference pattern.

Interferometric shape measurement of different signs of curvature

A measurement method for measuring a shape of a target using an interference pattern includes the steps of converting a first interference pattern into a first shape of the target (Sto S), obtaining a second interference pattern at a position where the target moves in an optical axis direction of the reference surface (S, S), unwrapping the second interference pattern after aligning a phase of the first interference pattern with a phase of the second interference pattern (S), converting the unwrapped second interference pattern into a second shape of the target (S), determining whether or not the first shape of the target coincides with the second shape (S), and calculating the shape of the target by adding the integral multiple of a wavelength of the light source to the unwrapped second interference pattern if the first shape does not coincide with the second shape (S).

Growing community of inventors

Utsunomiya, Japan

Yuki Oshima