Semiconductor Energy Laboratory Co., Ltd.

Yuki Okamoto

Yoshiyuki Kurokawa

Takayuki Ikeda

Shunpei Yamazaki

Tatsuya Onuki

Kei Takahashi

Takanori Matsuzaki

Hiroki Inoue

Munehiro Kozuma

Seiichi Yoneda

Takahiko Ishizu

Takeshi Aoki

Takuro Ohmaru

Minato Ito

Kengo Akimoto

Hajime Kimura

Hideki Uochi

Koji Kusunoki

Ryota Tajima

Satoru Okamoto

Hitoshi Kunitake

Yosuke Tsukamoto

Hironobu Takahashi

Shintaro Harada

Katsuki Yanagawa

Toshiki Hamada

Isamu Shigemori

Yasuhiko Takemura

Hisao Ikeda

Naoto Kusumoto

Yukinori Shima

Hiromichi Godo

Shuhei Nagatsuka

Susumu Kawashima

Hidetomo Kobayashi

Takashi Nakagawa

Yutaka Okazaki

Yuto Yakubo

Kazuki Tsuda

A semiconductor device with a novel structure is provided. The semiconductor device includes a silicon substrate including a first circuit, a first element layer including a second circuit, and a second element layer including a third circuit. The first circuit includes a first transistor. The second circuit includes a second transistor. The third circuit includes a memory cell. The memory cell includes a third transistor and a capacitor. The first element layer and the second element layer constitute a stacked block stacked and provided in a direction perpendicular or substantially perpendicular to a surface of the silicon substrate. A plurality of stacked blocks are stacked and provided in the direction perpendicular or substantially perpendicular to the surface of the silicon substrate. Each of the plurality of stacked blocks includes a first wiring provided in the direction perpendicular or substantially perpendicular to the surface of the silicon substrate. The plurality of stacked blocks are electrically connected to each other through the wiring.

Semiconductor device

A highly reliable memory device is provided. On a side surface of a first conductor extending in a first direction, a first insulator, a first semiconductor, a second insulator, a second semiconductor, and a third insulator are provided in this order when seen from the first conductor side. The first conductor is provided with a first region overlapping with a second conductor with the first insulator, the first semiconductor, the second insulator, the second semiconductor, and the third insulator provided therebetween, and a second region overlapping with a third conductor with the first insulator, the first semiconductor, the second insulator, the second semiconductor, and the third insulator provided therebetween. In the second region, a fourth conductor is provided between the first insulator and the first semiconductor.

Memory device

A novel memory device is provided. A first cell array including a plurality of memory cells and a second cell array including a plurality of memory cells are provided to overlap with each other. Two bit lines included in the first bit line pair are electrically connected to part of the memory cells included in the first cell array and to part of the memory cells included in the second cell array. Two bit lines included in the second bit line pair are electrically connected to part of the memory cells included in the first cell array and to part of the memory cells included in the second cell array. In the first cell array, one of the bit lines included in the second bit line pair includes a region overlapping with part of the first bit line pair. In the second cell array, the other of the bit lines included in the second bit line pair includes a region overlapping with part of the first bit line pair.

Memory device including plurality of overlap memory cell arrays with folded bit-lines

The invention of the application is the invention regarding a semiconductor device and a method for driving the semiconductor device. The semiconductor device includes first and second transistors, first to fifth switches, first to third capacitors, and a display element. The first transistor (M) comprises a back gate, a gate of the first transistor is electrically connected to the first switch (M), the second switch (M) and the first capacitor (C) are positioned between the gate of the first transistor and a source of the first transistor, the back gate of the first transistor is electrically connected to the third switch (M), the second capacitor (C) is positioned between the back gate of the first transistor and the source of the first transistor, the source of the first transistor is electrically connected to the fourth switch (M) and a drain of the second transistor (M), a gate of the second transistor is electrically connected to the fifth switch (M), the third capacitor (C) is positioned between the gate of the second transistor and a source of the second transistor, and the source of the second transistor is electrically connected to the display element ().

Semiconductor device and method for driving semiconductor device

A semiconductor device with a novel structure is provided. The semiconductor device includes a plurality of arithmetic blocks each including an arithmetic circuit portion and a memory circuit portion. The arithmetic circuit portion and the memory circuit portion are electrically connected to each other. The arithmetic circuit portion and the memory circuit portion have an overlap region. The arithmetic circuit portion includes, for example, a Si transistor, and the memory circuit portion includes, for example, an OS transistor. The arithmetic circuit portion has a function of performing product-sum operation. The memory circuit portion has a function of retaining weight data. A first driver circuit has a function of writing the weight data to the memory circuit portion. The weight data is written to all the memory circuit portions included in the same column with the use of the first driver circuit.

A highly reliable memory device is provided. On a side surface of a first conductor extending in a first direction, a first insulator, a first semiconductor, a second insulator, a second semiconductor, and a third insulator are provided in this order when seen from the first conductor side. A first region overlapping with a second conductor with the first insulator, the first semiconductor, the second insulator, the second semiconductor, and the third insulator therebetween, and a second region overlapping with a third conductor with the first insulator, the first semiconductor, the second insulator, the second semiconductor, and the third insulator therebetween are provided in the first conductor. In the second region, a fourth conductor is provided between the first insulator and the first semiconductor.

A semiconductor device with reduced power consumption is provided. The semiconductor device includes a node ND, a node ND, a resistor, a capacitor, and a comparison circuit. The resistor is electrically connected in series between one of a positive electrode and a negative electrode of a secondary battery and a first terminal. The resistor has a function of converting current flowing between the one of the positive electrode and the negative electrode of the secondary battery and the first terminal into a first voltage. The first voltage is added to a voltage of the node NDthrough the capacitor. The comparison circuit has a function of comparing a voltage of the node NDand the voltage of the node ND. The comparison circuit outputs a signal that notifies detection of overcurrent when the voltage of the node NDis higher than the voltage of the node ND

Semiconductor device and battery pack

A display apparatus that can display a high-resolution image can be provided. In the display apparatus, a first layer and a second layer are stacked. In the first layer, an arithmetic circuit and a data driver circuit and are provided, and in the second layer, a display portion is provided. In the arithmetic circuit, a neural network is configured. The display portion has a region overlapping with the data driver circuit. The arithmetic circuit has a function of performing arithmetic processing using the neural network on image data and supplying the arithmetically-processed image data to the data driver circuit.

Display apparatus

An imaging device with an arithmetic function in which the circuit size is reduced is provided. The imaging device includes a plurality of pixel blocks. Each of the pixel blocks includes N (N is an integer greater than or equal to 1) first circuits, N second circuits, and a third circuit. Each of the first circuits includes a photoelectric conversion device, and the photoelectric conversion device has a function of converting incident light into an electrical signal and has a function of outputting a first signal that is obtained by binarizing the electrical signal to the second circuit. Each of the second circuits has a function of outputting a second signal that is obtained by multiplying the first signal by a weight coefficient to a third circuit. When the N second signals are output to a wiring electrically connected to the third circuit, addition is performed. The first circuit includes a transistor, and an OS transistor is preferably used as the transistor.

Imaging device and electronic device

A battery control circuit having a novel structure, a battery protection circuit having a novel structure, and a power storage device including the battery circuit are provided. A semiconductor device includes n cell balancing circuits that respectively correspond to one secondary battery and each include a transistor, a comparator circuit, and a capacitor. In each of the n cell balancing circuits, an inverting input terminal of the comparator circuit and one electrode of the capacitor are electrically connected to one of a source and a drain of the transistor. The semiconductor device has functions of supplying a ground potential to the other electrode of the capacitor; turning on the transistor; supplying a first potential to the one electrode of the capacitor; turning off the transistor; electrically connecting the other electrode of the capacitor and a negative electrode of the secondary battery corresponding to each cell balancing circuit; supplying a sum of the first potential and a potential of the negative electrode of the secondary battery corresponding to each cell balancing circuit, to the one electrode of the capacitor; and controlling charging of the secondary battery corresponding to each cell balancing circuit.

Semiconductor device and operating method of semiconductor device

An information terminal capable of automatically adjusting the brightness of a display portion in accordance with bending of the display portion is provided. The information terminal includes a display portion that includes a first pixel, a second pixel, and a sensor element. The first pixel includes a liquid crystal element. The second pixel includes a light-emitting element. The sensor element includes a first bend sensor whose resistance is changed in accordance with bending of the display portion in a convex direction and a second bend sensor whose resistance is changed in accordance with bending of the display portion in a concave direction. The luminance of the light-emitting element is controlled in accordance with an output of the sensor element.

Information terminal

Safety is secured in such a manner that an anomaly of a secondary battery is detected with a protection circuit, for example, a phenomenon that lowers the safety of a secondary battery, particularly a micro short circuit, is detected early, and users are warned or the use of the secondary battery is stopped. A secondary battery protection circuit includes a first memory circuit electrically connected to a secondary battery, a comparison circuit electrically connected to the first memory circuit, a second memory circuit electrically connected to the comparison circuit, and a power-off switch electrically connected to the second memory circuit. The power-off switch is electrically connected to the secondary battery, and the first memory circuit includes a first transistor including an oxide semiconductor and retains a voltage value of the secondary battery in an analog manner.

Secondary battery protection circuit and secondary battery anomaly detection system

A semiconductor device storing data as a multilevel potential is provided. The semiconductor device includes a memory cell, first and second reference cells, first and second sense amplifiers, and first to third circuits. The first circuit has a function of outputting, to a first wiring and a third wiring, a first potential corresponding to a first signal output from the memory cell. The second circuit has a function of outputting, to a second wiring, a first reference potential corresponding to a second signal output from the first reference cell. The third circuit has a function of outputting, to the fourth wiring, a second reference potential corresponding to a third signal output from the second reference cell when a second switch is in an off state. The first sense amplifier refers to the first potential and the first reference potential and changes potentials of the first wiring and the second wiring. The second sense amplifier refers to the first potential and the second reference potential and changes potentials of the third wiring and the fourth wiring.

Semiconductor device including sense amplifier and operation method of semiconductor device

A semiconductor device capable of detecting a micro-short circuit of a secondary battery is provided. The semiconductor device includes a first source follower, a second source follower, a transistor, a capacitor, and a comparator. A negative electrode potential and a positive electrode potential of the secondary battery are supplied to the semiconductor device, a first potential is input to the first source follower, and a second potential is input to the second source follower. A signal for controlling the conduction state of the transistor is input to a gate of the transistor, and an output potential of the first source follower related to the potential between the positive electrode and the negative electrode of the secondary battery is sampled. The comparator compares the sampled potential with an output potential of the second source follower, whereby the semiconductor device can deal with a secondary battery in which the potential between the positive electrode and the negative electrode is changed by charge and discharge.

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Kanagawa, Japan

Yuki Okamoto