Mitsubishi Heavy Industries Thermal Systems, Ltd.

Yuki Nishizaki

Tatsuo Ishiguro

Katsuaki Morita

Satoshi Nikaido

Noriyuki Matsukura

Ryuji Ikeda

Hirotaka Oka

Kenichi Nagahara

Masumi Nomura

Sota Kogawa

A monitoring device includes: an operation record acquisition unit configured to acquire operation records indicating a transition in a load factor or a load change factor with respect to operation time leading up to failure in failure cases; a threshold setting unit configured to set a threshold to be contrasted with the load factor or the load change factor in the operation records of the failure cases; a wear rate acquisition unit configured to acquire a wear rate that is a value derived from a relation between the load factor or the load change factor and the threshold and indicates a degree of progress of wear of a device according to operation time; and a failure rate cumulative frequency acquisition unit configured to acquire a transition in a failure rate cumulative frequency of the failure cases with respect to the wear rate.

Monitoring device and monitoring method

An estimation device includes an observation system constraint determination unit configured to determine data within constraints that is data within a first constraint based on time series data of each observation value of a first observation value observed by a first observation system and a second observation value observed by a second observation system, a model estimation unit configured to estimate parameters of a plurality of models including an observation model that is a model of each of the observation systems and a physical model that is a model within an apparatus provided with each of the observation systems based on the data within constraints, and a consistency determination unit configured to determine consistency of the models based on a deviation between a first predicted observation value predicted from the second observation system based on the estimated parameters and the first observation value.

Estimation device and estimation method

An abnormality diagnosis device includes an abnormality determination unit configured to determine whether or not there is an abnormality with respect to a state quantity acquired from equipment and a cause estimation unit configured to estimate a cause of the abnormality in the equipment from a state quantity determined to be abnormal by the abnormality determination unit using a cause correspondence table in which a cause of an abnormal mode of the equipment identified in fault tree analysis is associated with the state quantity that is abnormal when the cause has occurred.

Abnormality diagnosis device and abnormality diagnosis method

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Tokyo, Japan

Yuki Nishizaki