Fuji Corporation

Yuki Inaura

Shuichiro Kito

Takahiro Kobayashi

Tomoya Fujimoto

Hiroshi Oike

Masafumi Amano

Yuta Yokoi

Kenji Sugiyama

Mikiya Suzuki

An inspection device is such that the inspection device executes a mounting inspection of a component using an inspection image of a board on which the component is mounted and includes an imaging device and an image processing device. The imaging device obtains three monochromatic images of the board in R, G, B. The image processing device sets a board color using brightness values of the three monochromatic images obtained by the imaging device, calculates complementary colors of the board color so set, determines on a color component having a largest brightness value in individual color components of the complementary colors so calculated, and sets the monochromatic image having the color component so determined in the obtained three monochromatic images as the inspection image.

Inspection device

An image correction method for correcting multiple original images captured under illumination by multiple different light source colors in generating a composite image by superposing the original images, includes obtaining a correction amount for correcting a position of a fiducial mark recognized from a reference image of a specific light source color in reference images of the multiple different light source colors; obtaining correction amounts for correcting positions of the fiducial mark recognized from the reference images of other light source colors than a specific light source color to the reference position in the reference image of the specific light source color; and when the original images are captured, correcting collectively distortion aberration and chromatic aberration of the original images of the multiple different light source colors using the correction amounts associated with the multiple different light source colors.

Image correction method, imaging device, and inspection device

An inspection device that performs inspection by using an inspection image of a board on which multiple components are disposed, the inspection device includes a fixed focus type camera, a lifting/lowering mechanism configured to move the camera up or down relative to the board, a setting section configured to acquire height information of the components, and set a reference position separated from a top surface of the board by a distance corresponding to a height of each of the components according to a predetermined setting method such that an imaging surface of each component within an imaging range of the camera is included in a depth of field of the camera, and a control section configured to control the lifting/lowering mechanism and the camera such that the inspection image is captured after the camera is relatively moved up or down to focus on the reference position.

Inspection device and method for capturing inspection image

A management device for a board work machine includes a storage device storing version information in which a current version of software executed by a constitutive device of a board work machine in a production process is associated individually with the multiple constitutive devices and a version designation section configured to designate a version of the software which is to be applied to the production process based on a type of the production process and the version information.

Device for managing substrate processing machine

A component mounting device capable of selectively performing a tolerance check mode that recognizes a position of a lead after determining whether the size of a lead region is within a tolerance range, and a non-tolerance check mode that recognizes a position of the lead without performing determination of whether the size of the lead region is within the tolerance range. Therefore, even in cases in which it is difficult to set a tolerance range due to the tip of the lead being covered with a viscous fluid such as solder or plating, the position of the lead is appropriately recognized.

Component mounting device and position recognition method

A substrate working device including: an imaging device configured to image a substrate; a memory device configured to memorize various information; and an image processing device configured to perform, when specified work is performed with respect to multiple substrates, for a leading substrate, leading-substrate processing of performing imaging processing for detecting a specified detection target required for the specified work with respect to a leading image obtained by imaging the leading substrate using the imaging device, acquiring region information related to a region in the leading image in which the detection target was detected, and memorizing the region information in the memory device, and, for subsequent substrates except for the leading substrate, subsequent-substrate processing of setting a partial processing region in a subsequent image of the subsequent substrate captured by the imaging device based on the region information, and performing the image processing with respect to the set processing region.

Substrate working device and image processing method

A system for creating component shape data for image processing to be used when performing image recognition of a component to be mounted by a component mounter including drawing a wire frame on top of the component image such that the wire frame surrounds a measurement target portion of the component image displayed on a display section; automatically aligning the position of the side of the wire frame to the edge position of the measurement target portion; and creating the component shape data for image processing by measuring the shape data of the measurement target portion surrounded by the wire frame for which the four sides of the wire frame were automatically aligned with the edge positions in four directions of the measurement target portion by the automatic aligning.

Growing community of inventors

Chiryu, Japan

Yuki Inaura