Matsushita Electric Industrial Co., Ltd.

Panasonic Corporation

Yuji Ono

Tomohiro Kimura

Osamu Yamada

Shohroh Mochida

Hidenori Nagata

Rotating polygon mirrors are configured such that angles formed by a rotation axis and mirror surfaces differs from one another in the mirror surfaces in order to shift a collecting point of a scanning light flux in a sub-scanning direction in association with rotation at constant angular speed. A collecting point position forming optical system is configured such that the collecting point is moved in an inspection range Zr in a height direction Z. The XYZ scanning is performed by moving the inspection object in the sub-scanning direction such that the collecting point shifted in the sub-scanning direction and the height direction is linearly scanned in the height direction of the inspection object in synchronization with the rotation of the rotating polygon mirror at the constant angular speed, and the an appearance positional coordinate of the inspection object is determined by a confocal method to perform the appearance inspection.

Apparatus and method for appearance inspection

In a 3D-shape measurement apparatus, a photoreceptive optical system for linearly scanning a target-to-be-measured with a scanning light beam and guiding a reflected light beam from the object to a scanning convergence lens is constituted such that the position of an apparent emission point of the reflected light to be incident on the scanning convergence lens moves in the same direction as the direction along which the scanning light beam deviates due to deformation of a scanning optical system, and the apparent emission point is always positioned on a scanning plane even when the scanning position varies.

3D-shape measurement apparatus

There is provided an apparatus of inspecting a packaged state by scanning a packaged printed circuit board with a fine light beam and detecting reflection beams of the fine light beam in a plurality of directions. A fine light beam emitted from a light source is scanned on the packaged printed circuit board substantially vertically thereto by means of a polygon mirror and a light projection f.theta. lens. An optical path correcting system receives reflection beams scattered from the packaged printed circuit board and corrects optical paths of the reflection beams. The correction is done in such a way that reflection beams having constant directional vectors regardless of the change of the scanning position of the fine light beam are received and guided to light receiving positions complying with a height at a scanning position on a plurality of photoelectric conversion devices. Through this, the packaged state of parts is inspected at a high speed, with high accuracy and over a wide range without expanding the light receiving area of the photoelectric conversion device and without causing characteristics of triogonometrical survey to change with the scanning position.

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Ehime, Japan

Yuji Ono