Renesas Electronics America Inc.

Yuji Ikeda

Chun Cheung

Keerthi Varman Anna Jayaprakash

Fumihito Hayashi

Systems and methods for detecting an open condition in a master-slave configuration are described. In an example, a controller can be integrated in a slave device of a master-slave configuration. The controller can be configured to activate a current source to supply a current to a pin of the slave device. The controller can be further configured to compare a voltage measured at the pin of the slave device with a reference voltage. The controller can be further configured to, based on the comparison, determine a presence or an absence of an open condition associated with the pin of the slave device. The controller can be further configured to output a signal representing the determination of the presence or the absence of the open condition to a master device.

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Atsugi, Japan

Yuji Ikeda