Tokyo Institute of Technology

Osaka University

Yuji Hatano

Mutsuko Hatano

Takayuki Iwasaki

Jaewon Shin

Yoshie Harada

A physical state measurement apparatus includes a main solid material which generates fluorescence by excitation light from a light source part. A microwave application part applies microwaves to the main solid material so as to control an electron state of the main solid material. A detection part detects the physical state of an object to be measured by the fluorescence from the main solid material. A feedback part has a solid material for feedback and a control part and detects a difference in amplitude between operating points on a low-frequency side and a high-frequency side of a lowering portion of a spectrum amplitude centered on a resonance frequency of an electron spin resonance spectrum of fluorescence from the solid material for feedback and feedback-controls the microwave application part such that the difference becomes zero.

Physical state measurement device

A sensor includes two magnetic sensors detecting a magnetic field around an object, and outputting at least one of a magnetic field signal and a temperature signal, an optical system emitting the excitation light to the two magnetic sensors, and a processor calculating a difference between a magnetic fields corresponding to the magnetic field signal detected by the two magnetic sensors, wherein each of the magnetic sensors includes an element disposed around the object and having color centers, an antenna radiating a microwave magnetic field to the element, an optical sensor detecting an intensity of a fluorescence generated by the element, and outputting an intensity signal, and a controller calculating at least one of a magnetic field and temperature around the measurement object, and output at least one of a magnetic field signal indicating the calculated magnetic field and a temperature signal indicating the calculated temperature to the processor.

Sensor for measuring magnetic field by utilizing principle of optically detected magnetic resonance (ODMR)

A magnetic measuring device includes: a determination part configured to identify four maximum inclination points in an average value in a visual field of a light detection magnetic resonance spectrum and configured to determined a degree of decrease in relative fluorescence intensity and a microwave frequency at each of the maximum inclination points; a setting part configured to set a reference decrease degree of the relative fluorescence intensity in a predetermined area and configured to set operating point frequency initial values at four points at which the reference decrease degree is achieved, near the microwave frequencies at the respective maximum inclination points; a frequency update part configured to update operating point frequencies at the four points; and a frequency correction part configured to input the updated operating point frequencies to a microwave oscillator as corrected operating point frequencies.

Growing community of inventors

Tokyo, Japan

Yuji Hatano