Adv Antest Corporation

Yuichiro Harada

Yoshihiro Kato

Yuki Watanabe

Naoya Kimura

Tomoyuki Itakura

Kazuhiro Iezumi

Shuichi Inage

Koji Miyauchi

Keisuke Kusunoki

Kazuhiro Tsujikawa

A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.

Test apparatus and test method

According to the present invention, a signal display device includes: a first characteristic value measurement unit, a display unit, a second characteristic value measurement unit, and a display form changing unit. The first characteristic value measurement unit measures any one of characteristic values of a signal to be measured, and the display unit displays the characteristic value measured by the first characteristic value measurement unit while the characteristic value is associated with time. The second characteristic value measurement unit measures any one of the characteristic values of the signal to be measured, and the display form changing unit changes a display form on the display unit according to the characteristic value measured by the second characteristic value measurement unit.

Signal display device, method, and recording medium

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Tokyo, Japan

Yuichiro Harada