Nec Lcd Technologies, Ltd.

Nec Corporation

Ihi Corporation

Other

Hitachi, Ltd.

Nlt Technologies, Ltd.

Yuichi Yamaguchi

Hironori Kikkawa

Hidenori Ikeno

Michiaki Sakamoto

Fumihiko Matsuno

Teruaki Suzuki

Hiroshi Kanou

Masayoshi Suzuki

Hiroshi Kanoh

Youichi Murayama

Hiroshi Kano

Takahiko Watanabe

Hiroshi Sakurai

Koichi Inagaki

Hiroaki Hatanaka

Hiroki Kawai

Akinori Tsuda

Masahiro Takatori

Masaki Ohira

Ryuji Ishii

Toshiyuki Atsumi

Toru Okamoto

Tomohiro Mori

Kentarou Watanabe

Fumihiko Matuno

Sayo Yamaha

Takahiro Fukumaru

A strength evaluation method is a strength evaluation method for a composite material in which a plurality of fiber layers are laminated and includes a meandering state measuring process of measuring a meandering state of fibers of the plurality of fiber layers in a direction along the fiber layers, a meandering thickness measuring process of measuring a meandering thickness that is a thickness in a lamination direction of a part in which meanderings of fibers of the plurality of fiber layers occur, and a strength evaluation process of evaluating a strength of the composite material based on the meandering state and the meandering thickness.

Strength evaluation device and strength evaluation method

Provided are a method and device for detecting arrangement disorder of fibers in a conductive composite material. A coil () is disposed at a position at which the coil () faces the conductive composite material, and thereby a current can be applied to the conductive composite material. Thus, work or the like for attaching electrodes to the conductive composite material is not required. As a result, the arrangement disorder of the fibers in the conductive composite material can easily be detected. A method for detecting meandering of fibers in a conductive composite material includes a step of disposing a magnetic field sensor () at a position at which the magnetic field sensor () faces a surface (Sa) of the conductive composite material such that a direction (D) of a magnetosensitive axis is horizontal with the surface (Sa) and is parallel to coil faces (). Therefore, the magnetic field sensor () measures a magnetic field, and thereby a portion at which the arrangement disorder of the fibers in the conductive composite material is present can be detected.

Method for detecting arrangement disorder of fibers in conductive composite material, and device for detecting arrangement disorder of fibers in conductive composite material

Provided is a method for inspecting an electroconductive composite material including disposing a detection magnetic field measurement unit, disposing a correction magnetic field measurement unit, applying a current, acquiring a detection magnetic field strength, acquiring a correction magnetic field strength, and detecting a portion in which arrangement of carbon fibers is disordered. The operation includes calculating a correction coefficient using the correction magnetic field strength and correcting the detection magnetic field strength using the correction coefficient.

Method for inspecting electroconductive composite material and device for inspecting electroconductive composite material

A liquid crystal display device including a first substrate, a second substrate facing and spaced away from the first substrate, a liquid crystal layer sandwiched between the first and second substrates, a switching device formed on the first substrate, a first electrically insulating film randomly patterned on the first substrate, a second electrically insulating film covering the first electrically insulating film therewith, and having a wavy surface, and a reflection electrode formed on the second electrically insulating film, and electrically connected to an electrode of the switching device, wherein a light passing through the second substrate and the liquid crystal layer is reflected at the reflection electrode, and the second electrically insulating film extends outwardly from the first electrically insulating film by a certain length at an end of a display region in which images are to be displayed, such that a step formed by the first and second electrically insulating films in the vicinity of the end of the display region is smoothed.

Liquid crystal display device

Liquid crystal display device and method of fabricating the same

A switching element is formed on a substrate disposed proximate a liquid crystal layer. A two layer insulation film is formed on the substrate, including a lower film and an upper film. The two layer insulation film overlays the switching element. A convex/concave structure is formed on an upper surface of the two layer insulation film by removing portions of the upper film. A reflection electrode is formed on a surface of the convex/concave structure.

Method of producing a reflective liquid crystal display

A reflection type liquid crystal display device having excellent display capability even if the number of the photolithography process is reduced and a process for producing the device. A process includes the steps of (a) forming a source/drain wiring by using a first mask; (b) forming a thin film transistor region and gate wiring by using a second mask; (c) forming an opening for a transistor, in a passivation film by using a third mask; (d) forming a rough surface of the interlayer insulating film and to form an opening for the transistor by using a fourth mask by halftone exposure, and (e) forming a reflective metal which extend through the respective openings for the transistor in the passivation film and the interlayer insulating film so that it is electrically connected to the source wiring by using a fifth mask.

Reflection type liquid crystal display device with half tone exposure and method for making same

A liquid crystal display device includes (a) a first substrate, (b) a second substrate spaced away from and facing the first substrate, (c) a liquid crystal layer sandwiched between the first and second substrates, (d) a transistor formed on the first substrate, (e) a wiring layer formed on the first substrate and electrically connected to the transistor, (f) a reflection electrode formed on the first substrate, an external incident light being reflected at the reflection electrode towards a viewer, and (g) a compensation layer formed directly on the wiring layer. The reflection electrode does not cover the wiring layer therewith, and the compensation layer has almost the same height as a height of the reflection electrode, the height being measured from a surface of the first substrate.

Method of fabricating reflection type liquid crystal display

A reflection-type liquid crystal display according to the invention includes two glass substrates, a transparent electrode provided on one glass substrate, an insulator film which is provided on another glass substrate and on which an uneven structure is formed, a reflecting electrode provided on the insulator film, and a liquid crystal layer sandwiched between a side of the transparent electrode and a side of the reflecting electrode. The insulator film includes a first insulating layer in which a large number of depressions isolated as surrounded by protrusions are irregularly arranged and a second insulating layer covering the insulating layer entirely. The protrusions are all connected in a network, so that if some of these protrusions have weaker adherence with an underlying layer, they can be supported by the surrounding protrusions.

Reflection-type liquid crystal display and method for manufacturing the same

A TFT and a passivation film are formed on a transparent substrate and thereafter the passivation film is annealed. When measuring drain currents of a TFT at a fixed turn-on voltage (Von) and a fixed turn-off voltage (Voff), although performance of a TFT annealed (solid line) rarely changes, performance of a TFT not annealed (dashed line) changes to a large extent, in more detail, drain current drastically decreases in accordance with the change of TFT performance. This phenomenon means that on-resistance of a TFT not annealed is being increased to a great extent.

Method for manufacturing active matrix type liquid crystal display device comprising annealing of the passivation film

A reflection electrode has an undulated shape and whose normal direction is distributed unevenly to a specific azimuth angle and whose reflection light intensity depends on said azimuth angle. Openings are formed in that area of the reflection electrode which has a tilt angle of 0 degree to 2 degrees and/or a tilt angle of 10 degrees or higher. The retardation of a liquid crystal layer is changed by making the liquid crystal molecular alignment mode different between the openings and the reflection electrode, so that the intensity of output light is increased in reflection mode as well as in transmission mode. The balance of colors displayed in transmission mode is determined by determining the area of the openings in pixels of each color, and the color temperature is set higher in transmission mode than in reflection mode. This provides a semi-transmission type liquid crystal display which has an excellent visibility in reflection mode as well as in transmission mode.

Liquid crystal display

A reflector for a reflection-type LCD device is provided, which reflects efficiently incident light to the viewer's side and that suppresses the change of color tone. The reflector comprises a roughened surface having a protrusion pattern. The protrusion pattern gives inclination angle to the surface according to a specific distribution where a first component with an inclination angle value of 0&#xb0; is 15% or less in area and a second component with an inclination angle value from 2&#xb0; to 10&#xb0; is 50% or greater in area. The protrusion pattern gives a variation range of chromaticity coordinates (x, y) on a chromaticity diagram dependent on an angle of view. The variation range is limited in a circle on the chromaticity diagram. The circle has a radius of approximately 0.05 and a center at a point corresponding to white color.

Reflector and reflection-type LCD device using the same

Growing community of inventors

Tokyo, Japan

Yuichi Yamaguchi