Fujitsu Corporation

Fujitsu Semiconductor Limited

Toshiba Plant Systems & Services Corporation

Yuichi Watanabe

Eiji Takada

Kouji Uesaka

Yuushin Kimura

Shigeru Goto

Yasuhiko Tandou

Kiyotaka Shinada

Ryujiro Sugano

A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.

Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method

Maintainability of a traversing in-core probe is improved without any hindrance to passage and the like in an access tunnel in which an indexing device of a TIP system is installed. An indexing device installation unit provided in the TIP system includes: a base on which an indexing device of a traversing in-core probe used in a nuclear reactor is mounted; a holding part holding the base in a suspended state in an access tunnel formed in a nuclear reactor containment vessel; and a lift mechanism moving up and down the base held by the holding part together with the indexing device.

Indexing device installation unit

Growing community of inventors

Yokohama, Japan

Yuichi Watanabe